抄録
Measurements of the intensity of diffracted X-rays by G. M. counter become difficult when the fluctuation of the main voltage causes variations in the intensity of X-ray source.
This difficulty was solved by controlling the sensitivity of the counting rate meter using the amplified output voltage of themonitor ionization chamber rendering the output of the meter to give the ratio of the intensities of diffracted and incident X-rays. With a proper control, the measurement is possible if the fluctuation of the main voltage remains within ±8%.
