抄録
Today, there is an increased need for quality control in the manufacturing sectors. Particularly, the automated detection of the product surface defect is essential to fulfill the requirement of quality assurance. In this research, the algorithm of surface defect detection by use of wavelet transform has been developed. This method is established by one-dimensional wavelet filter. However, the image processing of 2D image for defect detection should be applied by two-dimensional filter. Therefore, in this report, a new wavelet transform is developed with 2D filter and the method is called for areal wavelet transform. This areal wavelet transform is investigated and is confirmed the efficacy.
