Proceedings of the Annual Conference of the Institute of Systems, Control and Information Engineers
The 51st Annual Conference of the Institute of Systems, Control and Information Engineers
Session ID : 4T1-3
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Simplified Machine Diagnosis Techniques Using AR Model of Absolute Deterioration Factor
Kazuhiro Takeyasu*Yasuo Ishii
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Abstract
In order to make machine diagnosis, the method of calculating Kurtosis or Bicoherence was utilized. Calculating system parameter distance was also utilized applying time series data to AR(Auto Regressive) model or ARMA(Auto Regressive Moving Average) model. In this paper, simplified calculation method of machine diagnosis techniques is introduced utilizing system parameter distance under the application for AR model. Furthermore, absolute deterioration factor such as Bicoherence is introduced.
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© 2007 The Institute of Systems, Control and Information Engineers
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