Inhomogeneity of each thermoelements of type T thermocouples

Yoichi Tamura; Chihiro Uematsu

doi:10.11499/sicep.2002.0.224.0

SICE Annual Conference 2002

DOI https://doi.org/10.11499/sicep.2002.0.224.0

会議情報

主催: The Society of Instrument and Control Engineers

共催: IEEE/Industiral Electronic Society, IEEE/Robotics and Automation Society, IEEE/Control System Society

Inhomogeneity of each thermoelements of type T thermocouples

Yoichi Tamura, Chihiro Uematsu

著者情報

キーワード: Inhomogeneity of Seebeck coefficient, T thermocouples, each thermoelement

会議録・要旨集フリー

p. 224

詳細

抄録

Some studies on inhomogeneity of type K thermocouples were reported, but inhomogeneity of each thermoelement of the thermocouples was not reported. We studied inhomogeneity of each thermoelement of T thermocouples and verified experimentally that inhomogeneity of each thermoelement can be measured by using grounded-junction sheathed thermocouples. After annealing at 400 degrees Celsius and 250 hours, the positive leg (Copper) of T thermocouples did not reveal no inhomogeneity but the negative leg(Constantan) revealed some inhomogeneity.

責任著者(Corresponding author)

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