28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation

Xu BAI; Ryusuke NEBASHI; Makoto MIYAMURA; Kazunori FUNAHASHI; Naoki BANNO; Koichiro OKAMOTO; Hideaki NUMATA; Noriyuki IGUCHI; Tadahiko SUGIBAYASHI; Toshitsugu SAKAMOTO; Munehiro TADA

doi:10.1587/transele.2021FUS0005

Special Section on Fundamentals and Applications of Advanced Semiconductor Devices

28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation

Xu BAI, Ryusuke NEBASHI, Makoto MIYAMURA, Kazunori FUNAHASHI, Naoki BANNO, Koichiro OKAMOTO, Hideaki NUMATA, Noriyuki IGUCHI, Tadahiko SUGIBAYASHI, Toshitsugu SAKAMOTO, Munehiro TADA

著者情報

Xu BAI
NanoBridge Semiconductor, Inc.
Ryusuke NEBASHI
NanoBridge Semiconductor, Inc.
Makoto MIYAMURA
NanoBridge Semiconductor, Inc.
Kazunori FUNAHASHI
NanoBridge Semiconductor, Inc.
Naoki BANNO
NanoBridge Semiconductor, Inc.
Koichiro OKAMOTO
NanoBridge Semiconductor, Inc.
Hideaki NUMATA
NanoBridge Semiconductor, Inc.
Noriyuki IGUCHI
NanoBridge Semiconductor, Inc.
Tadahiko SUGIBAYASHI
NanoBridge Semiconductor, Inc.
Toshitsugu SAKAMOTO
NanoBridge Semiconductor, Inc.
Munehiro TADA
NanoBridge Semiconductor, Inc.

キーワード: FPGA, atom switch, non-volatile, resistive-change memory (RRAM), programmable logic, static timing analysis (STA)

ジャーナル認証あり

2022 年 E105.C 巻 10 号 p. 627-630

DOI https://doi.org/10.1587/transele.2021FUS0005

Browse “Advance online publication” version

詳細

抄録

A static timing analysis (STA) tool for a 28nm atom-switch FPGA (AS-FPGA) is introduced to validate the signal delay of an application circuit before implementation. High accuracy of the STA tool is confirmed by implementing a practical application circuit on the 28nm AS-FPGA. Moreover, dramatic improvement of delay and power is demonstrated in comparison with a previous 40nm AS-FPGA.

責任著者(Corresponding author)

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