IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Regular Section
A Clock Generator with Clock Period, Duty-Ratio and I/Q-Balance Adjustment Capabilities for On-Chip Timing-Margin Tests
Shunichi KAERIYAMAMikihiro KAJITAMasayuki MIZUNO
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ジャーナル 認証あり

2011 年 E94.C 巻 1 号 p. 102-109

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A 4-phase clock generator, which can dynamically change clock frequencies, duty ratios and I/Q balance, is proposed for on-chip timing margin testing. The clock generator macro is integrated into the microprocessor chip of the supercomputer SX-9, which is fabricated with a 65nm CMOS technology. It demonstrates frequency syntheses of 1.68GHz to 3GHz range, an instant frequency change capability for timing margin testing, duty ratio and I/Q balance adjustments of -12.5ps to 9.4ps with a 3.125ps step resolution.
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© 2011 The Institute of Electronics, Information and Communication Engineers
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