IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Microwave and Millimeter-Wave Technology
Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —
Shuhei AMAKAWA
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JOURNAL FREE ACCESS

2016 Volume E99.C Issue 10 Pages 1100-1112

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Abstract

The most commonly used scattering parameters (S parameters) are normalized to a real reference resistance, typically 50Ω. In some cases, the use of S parameters normalized to some complex reference impedance is essential or convenient. But there are different definitions of complex-referenced S parameters that are incompatible with each other and serve different purposes. To make matters worse, different simulators implement different ones and which ones are implemented is rarely properly documented. What are possible scenarios in which using the right one matters? This tutorial-style paper is meant as an informal and not overly technical exposition of some such confusing aspects of S parameters, for those who have a basic familiarity with the ordinary, real-referenced S parameters.

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© 2016 The Institute of Electronics, Information and Communication Engineers
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