IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Regular Section
Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data
Zheng-Liang HUANGFa-Xin YUShu-Ting ZHANGHao LUOPing-Hui WANGYao ZHENG
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2009 Volume E92.A Issue 9 Pages 2376-2379

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Abstract

GaAs MMICs (Monolithic Microwave Integrated Circuits) reliability is a critical part of the overall reliability of the thermal solution in semiconductor devices. With MMICs reliability improved, GaAs MMICs failure rates will reach levels which are impractical to measure with conventional methods in the near future. This letter proposes a methodology to predict the GaAs MMICs reliability by combining empirical and statistical methods based on zero-failure GaAs MMICs life testing data. Besides, we investigate the effect of accelerated factors on MMICs degradation and make a comparison between the Weibull and lognormal distributions. The method has been used in the reliability evaluation of GaAs MMICs successfully.

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© 2009 The Institute of Electronics, Information and Communication Engineers
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