Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Issue : Frontier in Nanoscale Three-Dimensional Analysis
Progress of Three-Dimensional Atomic Image Investigations by X-Ray Fluorescence Holography
Shinya HOSOKAWAKouichi HAYASHIKoji KIMURANaohisa HAPPOTomohiro MATSUSHITA
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2018 Volume 61 Issue 12 Pages 784-789

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Abstract

In recent years, X-ray fluorescence holography (XFH) investigations are remarkably developed to draw three-dimensional (3D) atomic images and to clarify local structures of functional materials, which can compensate for disadvantages of other methods for structural characterizations such as diffraction and X-ray absorption fine structure (XAFS). One of the important topics on the XFH experiments is to find an impurity site in a crystal. The second is to utilize a two-dimensional detector for saving data acquisition time and for conducting valence-selective XFH experiments. In this article, recent progresses of the XFH technique and their applications to functional materials are introduced.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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