Quantitative Evaluation of Sub-nm Surface Roughness via RHEED-derived Surface Ordering
Released on J-STAGE: September 10, 2026 |
Article ID 2026-015
Rivaldo Marsel Tumbelaka, Yoshihiro Kitagawa, Yuki Ida, Toya Fujiwara, Azusa N. Hattori, Hiroki Momono, Ken Hattori
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