解説21.イメージングの基礎と最新動向
(4) ナノスケール赤外分光法AFM-IR による界面分析
2019 年 55 巻 7 号 p. 278-284
詳細
2019 年 55 巻 7 号 p. 278-284
Infrared（IR）spectroscopy has been a powerful tool for chemical structural analysis of adhesive interfaces thanks to its high sensitivity to polar functional groups. However, its spatial resolution is limited to a few micrometers at most by diffraction limit. Recently, combination of AFM with IR laser sources develops several kinds of IR spectroscopy with nanometer spatial resolution. Among them, AFM-IR which detects IR absorption through photothermal expansion of a sample has been used widely in both academic and industrial fields. The principle of AFM-IR and its applications to interfacial analyses are introduced.
