抄録
Recently, we developed a retarding field analyzer (RFA) with high energy resolution and wide acceptance angles, which was installed at BL25SU in SPring-8, Japan. This apparatus enables us to measure photoelectron angular distributions (photoelectron holograms) with a solid angle of ±49° in a few minutes, and this approach is now being applied to measure the atomic arrangements of dopants and interfaces. However, correcting the sensitivity distribution of the measured images by the RFA is important in processing this data. The sensitivity distribution of the RFA is difficult to measure directly because it depends on the geometry of a sample, the kinetic energy of the photoelectrons, and so forth. Therefore, we developed an image processing algorithm to estimate the sensitivity distribution using spherical harmonics. This approach is more accurate than a Fourier transform and can efficiently correct the sensitivity distribution. Moreover, the algorithm can also be adopted in a wide variety of other applications in addition to RFA measurements.
