PB51 固体表面上の液晶薄膜における粘弾性の膜厚依存性II(物理・物性,ポスター発表,2013年日本液晶学会討論会)

抄録

It has been reported that liquid crystal thin films of 64 nm thick or thinner exhibited solid-like characteristics losing liquid crystallinity. In the present study, viscoelastic behavior in the re-evaporation process of liquid crystal thin films was investigated by using a quartz crystal microbalance (QCM). The results indicate a formation of a non-volatile layer restricted strongly by solid substrate in comparison with a solid-like interfacial layer.