等方-ネマチック点転移境界を利用したネマチック液晶のトポロジカル欠陥パターン・エンジニアリング

抄録

Herein this presentation, we demonstrate a simple method for large-scale patterning of topological defects in nematic liquid crystals. Our approach is based on dragging of defects formed at the frontier of the Iso-N transition by shear flow or by temperature gradient control. The fabricated large-scaled topological patterns are surprisingly stable and memorized through the surface anchoring. Topological polymeric films are also fabricated on the basis of the present technique.