IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm
Peng LiuZhiqiang YouJishun KuangZhipeng HuWeizheng Wang
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2015 Volume 12 Issue 23 Pages 20150839


As an attractive option of future non-volatile memories (NVM), resistive random access memory (RRAM) has attracted more attentions. Due to its high density and low power, one memristor (1R) crossbar is a dominant RRAM structure. In this paper, we propose a logic operation-based design for testability (DFT) architecture for 1R crossbar testing. In this architecture, memristor-aided logic (MAGIC) NOR gates are embedded to check whether all the cells in the crossbar are 0 s or not at a time. A March-like test algorithm is also presented for the proposed architecture, which covers all modeled faults. The test time is reduced drastically with a little area overhead.

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© 2015 by The Institute of Electronics, Information and Communication Engineers
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