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Jinwei Li
Key Laboratory of Microelectronic Device and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences School of Integrated Circuits, University of Chinese Academy of Sciences High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics of Chinese Academy of Sciences
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Bing Sun
Key Laboratory of Microelectronic Device and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics of Chinese Academy of Sciences
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Dongze Li
Institute of Microelectronics of Tsinghua University
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Qingzhen Xia
Department of Electronics, Peking University
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Jiawei Huang
Key Laboratory of Microelectronic Device and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences School of Integrated Circuits, University of Chinese Academy of Sciences High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics of Chinese Academy of Sciences
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Lei Wu
Key Laboratory of Microelectronic Device and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences School of Integrated Circuits, University of Chinese Academy of Sciences High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics of Chinese Academy of Sciences
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Hudong Chang
Key Laboratory of Microelectronic Device and Integrated Technology, Institute of Microelectronics of the Chinese Academy of Sciences High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics of Chinese Academy of Sciences
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Rui Jia
High-Frequency High-Voltage Device and Integrated Circuits R&D Center, Institute of Microelectronics of Chinese Academy of Sciences
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Honggang Liu
Department of Electronics, Peking University