抄録
A novel measurement method of material parameters for uniaxially anisotropic artificial dielectrics is proposed. The method utilizes the transmission characteristics with a waveguide. This method is valid for the artificial dielectrics where the size of constituting particles is negligibly small compared with the wavelength, and the frequency dependency of the material parameters is very small. Our method requires only one piece of sample for measurement. In the case where the test piece of the material is thin enough, the material parameters can be calculated analytically. The theoretical considerations are confirmed by the experiments for artificial dielectrics.
