電気学会論文誌C(電子・情報・システム部門誌)
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
エネルギーサブトラクション法を用いたCSPはんだ接続部の抽出
山口 博司寺本 篤司伊里 年生堀場 勇夫杉江 昇
著者情報
ジャーナル フリー

2000 年 120 巻 1 号 p. 34-39

詳細
抄録
X-ray images have been used as a way of inspecting solder joints of BGA packages and CSP. But, in X-ray images, other parts are piled up, besides the solder joints which are being subject to inspection. We propose a new method for extracting the solder joints using energy subtraction method. The technique employs the fact that photon energy characteristic of attenuation coefficient is specific to the materials. Concretely, the X-ray spectrum is made to change by appropriately controlling the voltage of the X-ray tube, and two images are taken. Next we conduct contrast correction so that the gray level of the region where X-ray does not permeate solder joints may become equal. Lastly, by subtracting the images, the lead, which is the main constituent of the solder, is extracted. This technique has been verified through both the simulation studies and the prototype system. A good result where solder joints are clearly extracted is provided. By using this technique, it becomes easy to extract automatically the region of the solder joints from X-ray images.
著者関連情報
© 電気学会
前の記事 次の記事
feedback
Top