TOF-SIMS MS/MS Depth Profiling of OLED Devices-Toward the Elucidation of Degradation Process-

抄録

TOF-SIMS depth profiling is a common way to evaluate the OLED devices. However, the depth profiles of OLEDs are still complicated due to the mass interference from other organic compounds. In this study, in order to extract the accurate depth distributions from conventional depth profiles, MS/MS depth profiling method has been applied. This new method enables us to determine the specific molecular depth distributions of individual organic compounds, and understand the degradation mechanism.