抄録
A unique specimen holder for LEED (low energy electron diffraction) and AES (Auger electron spectroscopy) study at high temperatures has been developed with considerable success. It enables us to observe the LEED pattern of a clean W(100) surface with enough contrast using a commercial-type LEED system at 1400 K. AES spectrum for the W(100) surface at 1400 K has been successfully measured without any effects caused by the heating of the specimen. The present result leads us to the confirmation that the developed specimen holder is well worthy to be applied to the systematic study of the Sc-O/W(100) system at high temperatures.
