抄録
We have developed a new ion diagnosis method, namely “a backscattering technique,” for high energy
ions by utilizing a combination of one CR-39 detector and plastic plates, which enables to detect high
energy ions beyond the detection threshold limit of CR-39 detectors. This detection method coupled
with a magnetic spectrometer is applied to identify high energy ions of 50 MeV per nucleon in laserdriven
ion acceleration experiments using cluster-gas targets.
