IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Fundamentals and Applications of Advanced Semiconductor Devices
Phonon-Drag Contribution to Seebeck Coefficient in P-Type Si, Ge and Si1-xGex
Veerappan MANIMUTHUMuthusamy OMPRAKASHMukannan ARIVANANDHANFaiz SALLEHYasuhiro HAYAKAWAHiroya IKEDA
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2017 年 E100.C 巻 5 号 p. 482-485

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The phonon-drag contribution to the Seebeck coefficient (Sph) for p-type Si, Ge and Si1-xGex is investigated for thermoelectric applications. The Sph in Si and Ge is found to mainly determined by the phonon velocity, phonon mean free path and carrier mobility associated with acoustic deformation potential scattering. Moreover, the Sph in Si1-xGex is predictable by the above-mentioned material parameters interpolated with those in Si and Ge.

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© 2017 The Institute of Electronics, Information and Communication Engineers
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