In this paper, a VLSI-oriented, fast reconstruction algorithm from projection data of a few directions is proposed, which is based on wavelets sampling model, singular value decomposition, part area reconstruction and uniformity scanning method. At first, by imbedding the classical Shannon sampling theorem in wavelet theory, reconstruction algorithm with wavelet sampling function has better efficiency and less error. Then, by means of combination of multiple wavelets sampling model and singular value decomposition, moderate CT image with least squares of error can be reconstructed by sum of products operation. In addition, as this algorithm is suitable for being achieved by massive parallel processing, it will be possible to develop faster, more compact and economic industry-oriented CT system. At last, The results of computer simulation with these reconstruction algorithms are presented.
View full abstract