Dual Scanning Majority (DSM) Method based on Electron Backscatter Diffraction (EBSD) method was proposed as a new method to determine crystallographic orientations of Yttria-Partially Stabilized Zirconia (PSZ) used as top coat (TC) layer of Thermal Barrier Coating (TBC). For TC layer of TBC exposed at 900°C for 300 hrs, three dimensional microstructures were reconstructed by EBSD-DSM method combined with Focus Ion Beam (FIB) serial sectioning, and microstructural features, the grain shape and the crystallographic orientation, were characterized. Splat grains in TC layer had strongly preferred orientation of (001) plane in perpendicular to the splat grain boundary.

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