Journal of Quality Engineering Society
Online ISSN : 2189-9320
Print ISSN : 2189-633X
ISSN-L : 2189-633X
Volume 1, Issue 3
Displaying 1-5 of 5 articles from this issue
  • Genichi Taguchi
    1993Volume 1Issue 3 Pages 2-7
    Published: June 01, 1993
    Released on J-STAGE: December 24, 2016
    JOURNAL FREE ACCESS

    The importantness of productivity to improve living standard is discussed first and then the role of technology for productivity is introduced. Quality engineering is intended to improve the efficiency of technology development within R&D with specimen instead of actual product design. Finally quality and cost trade-off is explained with loss function.

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  • Kazuo Tatebayashi
    1993Volume 1Issue 3 Pages 12-18
    Published: August 15, 1993
    Released on J-STAGE: March 24, 2016
    JOURNAL FREE ACCESS
    When engineers see a case study of Robust Design, particularly one involving recent technologydevelopment, they feel that it is quite dlfferent from the traditional DOE (design of Experiment). What are the differences between traditional characteristics and the SN ratioof dynamic and static characteristic of quality engineering? ln addition, what relationships do they have ? Therefore, I would like to explain characteristics for quality improvement, comparing the SN ratio of dynamic and static characteristic in quality engineering to the traditional characteristics.
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  • Mikio lwase, Tokio Sawataishi
    1993Volume 1Issue 3 Pages 19-24
    Published: August 15, 1993
    Released on J-STAGE: March 24, 2016
    JOURNAL FREE ACCESS
    The differential amplifier circuit is one of the most important basic circuit used in analog integrated circuit. ln designing this circuit integrated as an LSI, we have conducted a parameter design using a dynamic characteristic. The ideal function of this circuit is to generate the output voltage equal to the input voltage. ln order to achieve its robust function, it is essential to take LSI manufac turing variability noise factors into consideration. We have found the conventional method where circuit elements were simulated at 3-1evels(min./mean/max.)to determine the optimum design,cannot reduce variability of output voltage effectively. At this time, we selected circuit parameters that may influence the characteristic and assigned them to an L18 orthogonal array and conducted a parameter design by varying LSI manufacturing noise factors. Circuit simulator was used to run the experiments. As a result we have confirmed that we can achieve our objective.
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  • Shinchi Kazashi, lsamu Miyazaki
    1993Volume 1Issue 3 Pages 25-32
    Published: August 15, 1993
    Released on J-STAGE: March 24, 2016
    JOURNAL FREE ACCESS
    With the advancement of electronic and electrical components, higher density printed circuit boards are on the way. ln order to competitive, it is essential to optimize the robust functions for future boards. ln the past, we have been using quality characteristics such as "Bridge" and "Non - soldering" to evaluate performance of soldering. This time, we have conducted a parameter design to study the robustness of basic function of soldering process. We were able to develop technology for future soldering process. The details are reported hereafter.
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