Open Lead Detection Method by Sensing the Switching Current of CMOS Gate on Sensing Probe

Abstract

We propose a new test method for detecting open leads on ICs. The test method is based on using the supply current of a CMOS gate as an open lead detector; the current flows when an AC voltage signal is provided to a targeted lead with a probe as a stimulus. To evaluate the test method, we examined whether it could detect open leads in SSIs and LSIs. The experimental results confirm that open leads can be detected within 1 μsec by providing an AC voltage signal with an amplitude that is 60% of the power supply voltage of the targeted IC.