Journal of The Japan Institute of Electronics Packaging
Online ISSN : 1884-121X
Print ISSN : 1343-9677
ISSN-L : 1343-9677
Special Articles / Latest Trends in Boundary-Scan Technology
Improve the Testability with In-Circuit Test and Boundary Scan Test
Takaichi Mizuno
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2021 Volume 24 Issue 7 Pages 653-658

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