Journal of The Japan Institute of Electronics Packaging
Online ISSN : 1884-121X
Print ISSN : 1343-9677
ISSN-L : 1343-9677
Acid Copper Plating Additive for Via-Filling
Takashi MATSUNAMITomoko ITOYuka IWAMOTOShigeru YAMATO
Author information
JOURNAL FREE ACCESS

2001 Volume 4 Issue 7 Pages 629-633

Details
Abstract
We investigated the influence of organic nitrogen compounds (leveler) as additive for acid copper plating for via-filling. By applying of Cyclic Voltammetric Stripping (CVS), we confirmed the effect of leveler to copper electrodeposition. The leveler which is effective to via-filling inhibits electrodeposition with an increase in rotation speed of rotating disk electrode, and the effect to suppress electrodeposition is controlled by thickness of diffusion layer. Therefore, the electrodeposition at via outside having thin diffusion layer is suppressed and preferentially fill the via bottom. However, many levelers influence to film properties. Cationic dye decreases elongation and thiourea derivative increases internal stress. By selecting proper levelers (polyamine derivative), we could gain the additive having excellent via-filling effect and film properties.
Content from these authors
© The Japan Institute of Electronics Packaging
Previous article Next article
feedback
Top