TANSO
Online ISSN : 1884-5495
Print ISSN : 0371-5345
ISSN-L : 0371-5345
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Volume 2009, Issue 236
Displaying 1-5 of 5 articles from this issue
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Research Papers
  • Soft X-ray absorption spectra in the CK region of carbon black and spectral analysis using the discrete variational Xα method
    Yasuji Muramatsu, Ryusuke Harada, Muneyuki Motoyama, Eric M. Gullikson
    Article type: Research Papers
    2009 Volume 2009 Issue 236 Pages 2-8
    Published: January 15, 2009
    Released on J-STAGE: November 11, 2010
    DOIhttps://doi.org/10.7209/tanso.2009.2
    JOURNAL FREE ACCESS
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    To investigate the local structure of carbon black (CB) crystallites, soft X-ray absorption spectra (XAS) in the CK region of CB were measured using synchrotron radiation, and the π* peak profile in the CK-XAS was analyzed by the discrete variational (DV) Xα method. Compared to highly oriented pyrolytic graphite (HOPG), CB exhibits a broader π* peak profile where the intensity of the broad portion in CB is proportional to the hydrogen occluded in the CB. However, the broad portion cannot be reduced even in H2-degassed CB by thermal desorption. These findings on the broad π* peak profile can be simulated by the unoccupied C2p density of states (DOS) of the carbon atoms that form the nonbenzenoid rings and hydrogenated edge carbon atoms. Therefore, plausible origins for the broad π* peak in the CK-XAS of CB are the nonbenzenoid structure and/or hydrogenated edge carbon atoms in the graphitic crystallites.
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  • Quantitative and chemical-state analyses of surface oxygen on graphite oxides using total-electron-yield soft X-ray absorption spectroscopy
    Yasuji Muramatsu, Satoshi Ueda, Eric M. Gullikson
    Article type: Research Papers
    2009 Volume 2009 Issue 236 Pages 9-14
    Published: January 15, 2009
    Released on J-STAGE: November 11, 2010
    DOIhttps://doi.org/10.7209/tanso.2009.9
    JOURNAL FREE ACCESS
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    A new quantitative and chemical-state analysis method to measure oxygen on the surface of graphitic carbon materials by total-electron-yield soft X-ray absorption spectroscopy (TEY-XAS) is proposed, and applied to the analysis of graphite oxides (GO). In this method, working curves for quantitative analysis were successfully obtained from the relative absorption- peak-intensity in the OK and CK absorption edges as functions of the O/C atomic ratio in standard organic samples which have various oxygenated functional groups. The atomic ratio O/C on the GO surface was determined as approximately 0.35 from the working curves, and the chemical states of surface oxygen were estimated as mainly –OH and partially >C=O and/or –CH=O from the finger print method of the TEY-XAS.
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