Abstract
Ionic Migration reduces electronics reliability. There are many reports suggesting that the dissolving rate at the anode and deposition rate at the cathode influence the ionic migration time, when the short-circuiting occurs. Therefore, to analyze this ionic migration processes, in situ measurement of the electrode reaction of anode surface and cathode surface is indispensable. We have already reported that in situ measurement of the process of silver or copper migration in ion exchanged distilled water could be accomplished by applying a quartz crystal microbalance (here in after refered to as QCM) . In this report we observed these migration processes in various electrolytes involving inorganic ion and inhibitor via this QCM method.
