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Article type: Cover
1996Volume 6Issue 3 Pages
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Article type: Index
1996Volume 6Issue 3 Pages
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Article type: Index
1996Volume 6Issue 3 Pages
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Hiroshi Kashiwagi
Article type: Article
1996Volume 6Issue 3 Pages
181-
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Nobuyasu Ito
Article type: Article
1996Volume 6Issue 3 Pages
182-196
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The Monte Carlo simulational study of the Ising model is explained. The Ising model is the most elementary subject in the statistical physics, and its simulational study is a typical computing science. Many new problems of the computing science have been appearing firstly in this Ising problems because the most intensive simulation and the most extensive study have made for them. Some recent remarkable results in the simulational methods come from the Ising Monte Carlo, in which many computing researchers studying other problems will be interested, are introduced. The statistical-dependence analysis provides a new and a very practical method to study the correlation in a temporal data. The recycle method gives an efficient way to generate and use the random number.
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Norio Harada
Article type: Article
1996Volume 6Issue 3 Pages
197-212
Published: September 17, 1996
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A statistical mechanical placements theory for gate array LSI and its applications for interconnection length prediction and wireablity analysis are described. A gate array is defined as v_1×v_2 grid graph and logic circuit is done as a graph with at most one edge between a pair of verteices. In a placement we condider a wire as a particle and a wire length as a particle energy level in statistical mechanics. Then distribution of wire length k is expressed by E_k^0=W_k/(1+exp(-v+kup)(k=l, 2, …) same as FermiDirac Statistics. The approximated distribution is describe by P_k=ke^<-(k-1)/T>(1-e^<-1/T>)^2 with temperature T and then the mean R is (l+e^<-1/T>)/(1-e^<-1/T>). This theoritical distribution fits to actual wire length distribution in spite of unique parameter R(or T). A statistical optimal placement equation is deduced for the minimum average wire length. Solutions of the equation are applicable to wire length prediction and wireability analysis practically.
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Yoshimitsu Iwasaki
Article type: Article
1996Volume 6Issue 3 Pages
213-218
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Keiichi Handa
Article type: Article
1996Volume 6Issue 3 Pages
219-223
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Sei-ichi Takayanagi
Article type: Article
1996Volume 6Issue 3 Pages
224-226
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Sin Hitotumatu
Article type: Article
1996Volume 6Issue 3 Pages
227-230
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Kouichi Sakurai
Article type: Article
1996Volume 6Issue 3 Pages
231-234
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Satoshi Fujita
Article type: Article
1996Volume 6Issue 3 Pages
235-236
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Ichiro Hagiwara, Ken Naitoh
Article type: Article
1996Volume 6Issue 3 Pages
237-239
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Satoru Moriya
Article type: Article
1996Volume 6Issue 3 Pages
240-
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Satoshi Fujita, Masafumi Yamashita
Article type: Article
1996Volume 6Issue 3 Pages
241-242
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Article type: Appendix
1996Volume 6Issue 3 Pages
243-245
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Takashi Kako
Article type: Article
1996Volume 6Issue 3 Pages
246-247
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Fumiaki Machihara
Article type: Article
1996Volume 6Issue 3 Pages
247-249
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Morio Yoda
Article type: Article
1996Volume 6Issue 3 Pages
249-250
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Article type: Appendix
1996Volume 6Issue 3 Pages
251-252
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Article type: Index
1996Volume 6Issue 3 Pages
Toc3-
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Article type: Cover
1996Volume 6Issue 3 Pages
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Published: September 17, 1996
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