Journal of The Japan Institute of Electronics Packaging
Online ISSN : 1884-121X
Print ISSN : 1343-9677
ISSN-L : 1343-9677
Special Articles / Test for Mounting Board without Unreasonableness, Unevenness and Waste
Design for Testability Methods for Detecting Resistive Opens at Chip Interconnects
Hiroyuki Yotsuyanagi
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2023 Volume 26 Issue 2 Pages 198-202

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