IEEJ Transactions on Electronics, Information and Systems

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Volume 107, Issue 6

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Special Issue on “Semiconductor Simulation”

Hiromichi Ohashi

1987 Volume 107 Issue 6 Pages 495
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_495

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Trends on Semiconductor Simulation Technologies

Kunio Hane

1987 Volume 107 Issue 6 Pages 496-501
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_496

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VLSI Device Simulation

Hiroo Masuda, Toru Toyabe

1987 Volume 107 Issue 6 Pages 502-506
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_502

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VLSI Process Simulation

Shinji Onga

1987 Volume 107 Issue 6 Pages 507-512
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_507

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Application of VLSI Simulation to Fabrication Process

Norihiko Kotani, Yoichi Akasaka, Satoru Kawazu

1987 Volume 107 Issue 6 Pages 513-518
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_513

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A Survey of VLSI Circuit Simulation

Tetsuro Kage

1987 Volume 107 Issue 6 Pages 519-524
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_519

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Simulation Techniques for Power Devices and Composite Devices

Akio Nakagawa

1987 Volume 107 Issue 6 Pages 525-530
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_525

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High Speed Devices and Advanced Device Models

Kazutaka Tomizawa

1987 Volume 107 Issue 6 Pages 531-536
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_531

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Analysis of The Current Concentration Phenomena in a GTO Turn-off Process

Hideki Miyazaki, Hiroshi Fukui

1987 Volume 107 Issue 6 Pages 537-544
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_537

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Formulation and Simulation of Thyristor Circuits Including Self Turn-off Switches

Zhaoan Wang, Yoshishige Murakami

1987 Volume 107 Issue 6 Pages 545-552
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_545

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Optimization of a Miniaturized LDD-MOSFET based on a Hot-Carrier Simulation

Ryo Dang, Mitsutoshi Nakamura, Tetsunori Wada, Yutaka Akiyama, Shinji ...

1987 Volume 107 Issue 6 Pages 553-560
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_553

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DC-RF Inverter Operation Simulation for High-Frequency Power MOS-FETs Connected in Parallel

Kazuhisa Hayeiwa, Hiroaki Ikeda

1987 Volume 107 Issue 6 Pages 561-568
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_561

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Semiconductor Device Simulation of Power MOSFET for Automotive Application

Toyoki Ito, Masami Yamaoka, Yukio Tsuzuki, Kazuhiko Kondo

1987 Volume 107 Issue 6 Pages 569-574
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_569

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Two-Dimensional Numerical Analysis of GTO Turn-On Phenomena

Hiroshi Fukui, Takao Yaginuma

1987 Volume 107 Issue 6 Pages 575-582
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_575

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Difference between Control Procedures for Linear Time-invariant Stochastic System with Colored

Izumi Hanazaki, Kageo Akizuki

1987 Volume 107 Issue 6 Pages 583-588
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_583

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Calculation of Inductance on Ferrite core by Boundary Element Method

Masato Enokizono, Motomichi Oto

1987 Volume 107 Issue 6 Pages 589-594
Published: June 20, 1987
Released on J-STAGE: December 19, 2008

DOIhttps://doi.org/10.1541/ieejeiss1987.107.6_589

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