Spintronics, which utilizes spin and charge degrees of freedom, has produced a variety of devices such as non-volatile magnetic memory and microwave oscillators. In this paper, we report the results of a comprehensive approach to the analysis of structure, charge, and spin of spintronic materials and devices using a wide range of advanced synchrotron radiation tools, including magnetic Compton analysis, nuclear resonant scattering analysis, surface and interface X-ray diffraction, operando nanoelectronic structure analysis, and photoemission spectroscopy.
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