日本応用磁気学会誌

抄録を表示する抄録を非表示にする

Experimental electron mean free paths were utilized for determination of a lubricant thickness on thin film magnetic recording disks. The electron mean free path was obtained by experiments providing multi-point data on C-F peakheight ratio vs. the lubricant thickness. The thickness of a lubricant film on thin film magnetic recording disk was calculated from a diameter measured by optical microscope, lubricant density, and concentration of lubricant solutions. Thereafter we plotted the C-F peakheight ratio measured by XPS vs. the thickness. The electron mean free path was determined by the approximate slope which corresponds to an exponent. This experimental electron mean free path was compared with previously reported values. It is considered that this experiment is the best method to calculate the electron mean free path, so that the lubricant film thickness, which is more specific than the published thickness, is determined by using this experimental electron mean free path.

抄録全体を表示

PDF形式でダウンロード (319K)

J-STAGEへの登録はこちら（無料）