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Volume 17 (2010)
- Issue 3 Pages 157-
- Issue 2 Pages 64-
- Issue 1 Pages 2-
Volume 17, Issue 2
Displaying 1-2 of 2 articles from this issue
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Serial Lecture
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J.D. Lee, Takaharu Nagatomi, Goro Mizutani, Kadunaka Endo2010 Volume 17 Issue 2 Pages 64-86
Published: 2010
Released on J-STAGE: April 12, 2013
JOURNAL FREE ACCESSThe angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental tool to probe the momentum-resolved electronic structure, i.e., the electronic band dispersion ε(k), of solids and their surfaces. ARPES is also an ideal tool to address the question concerning the electron correlation effect on quasiparticle excitations in the low-dimensional (one- or two-dimensional) correlated electron systems. In this issue, we briefly introduce representative studies of ARPES and their fruitfulness from the free-electron-like three-dimensional systems to the low-dimensional strongly correlated electron systems.View full abstractDownload PDF (865K) -
II. The basis of average, interval estimation, and rejection testSei FUKUSHIMA2010 Volume 17 Issue 2 Pages 87-93
Published: 2010
Released on J-STAGE: April 12, 2013
JOURNAL FREE ACCESSOne of the most important items for the analyst is the handling of the numerical data. The almost analysts handle and treat the numeric data, significant figure or dispersion for example, obtained from the measurement in the correct way unconsciously. However, there are many analysts who lose the self-confidence, when they wish to use the description of the statistical terminology. This lecture is intended giving a starting point for giving the self-confidence and learning a systematic knowledge to such people. In present part of this lecture, the basis of average, interval estimation, and rejection test will be explained.View full abstractDownload PDF (633K)
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