Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Volume 27, Issue 2
Displaying 1-8 of 8 articles from this issue
Preface
Review
  • Yue Zhao, Masato Morita, Tetsuo Sakamoto
    2021 Volume 27 Issue 2 Pages 78-94
    Published: 2021
    Released on J-STAGE: December 29, 2022
    JOURNAL FREE ACCESS
    In this review, we discuss the use of time–of–flight secondary–ion mass spectrometry (TOF–SIMS) technology for analyzing the viscous glue (is called aggregate glue droplets) of spider orb webs and examine the results obtained. Element distribution images of the aggregate glue droplets were observed by TOF–SIMS. A uniform element distribution is seen for suspended pristine aggregate glue droplets, and a differential spreading of aggregate glue components is seen for attached aggregate glue droplets. We also observed TOF–SIMS images of water in aggregate glue droplets, where water was observed to be consistent with the distribution of oozing salt. We also found that the alkali metal in the aggregate glue droplets showed similar characteristics by feeding cesium carbonate to spiders.
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Technical Report
Extended Abstract (Review)
  • Satoshi Ninomiya, Mikihiro Kawase, Lee Chuin Chen, Kenzo Hiraoka
    2021 Volume 27 Issue 2 Pages 104-110
    Published: 2021
    Released on J-STAGE: December 29, 2022
    JOURNAL FREE ACCESS
    We have been studying vacuum electrospray droplet ion (V-EDI) beams for ionization and etching in surface analysis instruments. The V-EDI beams can ionize biomolecules with extremely high efficiency. If the V-EDI beams are applied to time-of-flight secondary ion mass spectrometry (TOF-SIMS) as primary ion beams, its analysis performance will be improved significantly. However, the V-EDI beams could not be practically utilized in common TOF-SIMS instruments, because shortly pulsed V-EDI beams cannot be produced. In this article, the current status of the V-EDI beam and towards TOF-SIMS applications will be described.
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Technical Note
Articles in Memory of Late Hideo Iwai
Postscript
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