Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Volume 25, Issue 2
Displaying 1-8 of 8 articles from this issue
preface
Review
Paper
  • Koji Nakanishi, Koji Kitada, Yoshiyuki Morita, Hajime Tanida, Yusuke T ...
    2018 Volume 25 Issue 2 Pages 90-102
    Published: 2018
    Released on J-STAGE: March 06, 2020
    JOURNAL FREE ACCESS
    The charge compensation mechanism of a LiNiCoMnO2 (NCM333) positive electrode, used in a commercial lithium ion battery, was investigated by operando soft X-ray absorption fine structure (SX-XAFS) spectroscopy. The SX-XAFS spectral analyses recorded with the partial fluorescence yield revealed followings. The pristine NCM333 consisted of Ni2+, Co3+, Mn4+ and O2-. During charge, Ni2+ was oxidized to Ni4+, and Mn4+ did not change at all. O2- was oxidized by creating O 2p holes during charge, which caused an appearance of a new pre-edge peak in the O K-edge XAFS spectra. Co L3-edge peak shifted to higher energy, indicating that Co3+ is oxidized during charge. Hence nickel ions play the central role of the charge compensation in the NCM333 positive electrode, and Mn ions are not contribute to the charge compensation. O ions and Co ions are not as large as Ni ions, but they are also contribute to the charge compensation.
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  • Wataru Ishikura, Kazuma Takahashi, Takayuki Yamagishi, Dan Aoki, Kazuh ...
    2018 Volume 25 Issue 2 Pages 103-114
    Published: 2018
    Released on J-STAGE: March 06, 2020
    JOURNAL FREE ACCESS
    Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) and scanning electron microscope (SEM) images were fused and then evaluated by means of principal component analysis. As a result, TOF-SIMS spatial resolution could be improved by adding SEM image information to TOF-SIMS data without drastic change of TOF-SIMS spectrum information. Sparse modeling and machine learning were applied to TOF-SIMS data to interpret complex TOF-SIMS spectra. Least Absolute Shrinkage and Selection Operator (LASSO) provided a simplified TOF-SIMS spectrum with less noise. Machine learning using Random Forest and k-Nearest Neigbour appropriately predicted unknown test samples by learning TOF-SIMS data similar the test samples.
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Extended Abstract
Serial Lecture (Extended Abstract): Practical Surface Analysis - Knowledge of Surface Analysis for Beginners
Corrigendum
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