Journal of The Society of Instrument and Control Engineers

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Volume 47, Issue 9

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Special Issue Intelligent Measurement for Nanoscale Manufacturing

Survey

Intelligent Measurement for Nano-Scale Manufacturing System

Kiyoshi TAKAMASU

2008Volume 47Issue 9 Pages 705-706
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.705

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Review

Surface Profile Measurement of Ultra-Precision Workpieces

Wei GAO, Yoshikazu ARAI

2008Volume 47Issue 9 Pages 707-712
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.707

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Nano Profile Measurement Using Mechano-Optical Probe

Satoru TAKAHASHI, Kiyoshi TAKAMASU

2008Volume 47Issue 9 Pages 713-719
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.713

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Ultra High Accuracy Measurement Technology for Angle

Tadashi MASUDA

2008Volume 47Issue 9 Pages 720-725
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.720

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Intelligent Measurement for Large Scale Workpiece Using Software Datum

Eiki OKUYAMA, Tatsuya KUME

2008Volume 47Issue 9 Pages 726-732
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.726

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Uncertainty Evaluation on Coordinate Metrology

Makoto ABE

2008Volume 47Issue 9 Pages 733-738
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.733

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A Hyper Wide Range Measurement of Machined Surfaces by Stiching Techniques

Kazuyuki SASAJIMA

2008Volume 47Issue 9 Pages 739-743
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.739

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Review

The Nano-CMM with a Microprobe Based on Optical Radiation Pressure Control Technique

Yasuhiro TAKAYA

2008Volume 47Issue 9 Pages 744-750
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.744

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On-Machine Measurement System for Micro Factory

Ichiro OGURA

2008Volume 47Issue 9 Pages 751-756
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.751

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Review

Standards for Nano-Scale Measuring Instruments

Sonko OSAWA, Satoshi GONDA, Ichiko MISUMI, Osamu SATO, Kentaro SUGAWAR ...

2008Volume 47Issue 9 Pages 757-762
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.757

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Nanometer Scale Length Standard Using Regular Crystalline Lattice

Masato AKETAGAWA

2008Volume 47Issue 9 Pages 763-768
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.763

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Measurement and Standard of Gear

Masaharu KOMORI

2008Volume 47Issue 9 Pages 769-774
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.769

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Review Series Medical Cyborg Technology

#6: Phantom Limbs in the Painful Brain

Masahiko SUMITANI, Satoru MIYAUCHI, Yoshitsugu YAMADA, Ryusuke KAKIGI

2008Volume 47Issue 9 Pages 775-779
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.775

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Conference Report

INSS 2008 (5th International Conference on Networked Sensing Systems)

Hideto IWAOKA

2008Volume 47Issue 9 Pages 780
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.780

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Division Report

8th Annual Conference on Control Systems

Masato ISHIKAWA

2008Volume 47Issue 9 Pages 781
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.781

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SICE Column

[title in Japanese]

[in Japanese]

2008Volume 47Issue 9 Pages 782-784
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.782

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Editorial Essay

Editorial Essay

Tsukasa WATANABE

2008Volume 47Issue 9 Pages 785
Published: September 10, 2008
Released on J-STAGE: November 16, 2022

DOIhttps://doi.org/10.11499/sicejl.47.785

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