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Akihiko Happoya, Masamitsu Aoki, Akio Takahashi
Session ID: 10A-01
Published: 2010
Released on J-STAGE: July 17, 2014
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Recently there is a heightened concern about global environmental problems and safety to human body. As for electronic/electrical equipments as well, it is indispensable to deal with the environment, and environmental friendliness and safety of higher levels are increasingly required. In this report, we outline the trend of printed wiring boards positively achieving environmental friendliness while satisfying various required characteristics.
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Genki Kanamori, Shinya Tanaka, Mitsuhiro Watanabe, Hideo Honma
Session ID: 10A-02
Published: 2010
Released on J-STAGE: July 17, 2014
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Manabu Yoshida, Kouji Suemori, Sei Uemura, Satoshi Hoshino, Noriyuki T ...
Session ID: 10A-03
Published: 2010
Released on J-STAGE: July 17, 2014
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We have developed and studied on materials for printable electronics.Printed electrodes having various work function are necessary for producing printable diode, printable EL device, and printable solar cell.In this paper, we will report a fabrication method of printed electrodes having various work function using our developed alloying technique.
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Mika Kagawa, Akio Takahashi, Toshiyuki Oyama
Session ID: 10A-04
Published: 2010
Released on J-STAGE: July 17, 2014
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Takahiro Kuwana, Mariko Htamura, Daisuke Wakuda, Katsuaki Suganuma
Session ID: 10A-05
Published: 2010
Released on J-STAGE: July 17, 2014
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Kazuhiro Nomura, Takuya Mizuno, Tomoki Isobe, Nobuo Ogura
Session ID: 10A-06
Published: 2010
Released on J-STAGE: July 17, 2014
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Kazutoshi Koshimizu, Akinobu Ono, Takayuki Imai, Shigeo Ota, Shinya Tn ...
Session ID: 10A-07
Published: 2010
Released on J-STAGE: July 17, 2014
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Shusei Tago
Session ID: 10B-01
Published: 2010
Released on J-STAGE: July 17, 2014
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Keitaro Yamagishi, Takuma Ishibashi, Soichiro Kametani, Tsuyoshi Kobay ...
Session ID: 10B-02
Published: 2010
Released on J-STAGE: July 17, 2014
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Pin grid array packages with ceramic substrate is not used now for LSI with many pins because it has less pins than ball grid array package and can not be applied for high speed singals. We have analyzed and designed this type of package and socket to transmit several Gbps class signals between printed circuit board and LSI.
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Makoto Suwada
Session ID: 10B-03
Published: 2010
Released on J-STAGE: July 17, 2014
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Takashi Shimizu, Hiroshi Nakano, Ryosuke Suga, Yoshinori Kogami, Yasut ...
Session ID: 10B-04
Published: 2010
Released on J-STAGE: July 17, 2014
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Yusuke Suzuki, Satoshi Yoneda, Hideyuki Ohashi, Seiichi Saito, Naoto O ...
Session ID: 10B-05
Published: 2010
Released on J-STAGE: July 17, 2014
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Tohru Matsushima, Tetsushi Watanabe, Yoshitaka Toyota, Ryuji Koga, Osa ...
Session ID: 10B-06
Published: 2010
Released on J-STAGE: July 17, 2014
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Takahide Nozaki, Hideyuki Nakanishi
Session ID: 10B-07
Published: 2010
Released on J-STAGE: July 17, 2014
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Norifumi Sasaoka
Session ID: 10B-08
Published: 2010
Released on J-STAGE: July 17, 2014
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We made so many kinds of our original FPC(Microstrip-Line,Strip-Line) in changing various factors. Changing factors are shape of GND pattern, width of signal pattern, thickness of copper, thickness of resin.We publish the effect of circuit design on transmission characteristics at FPC from data of Characteristic Impedance and S-parameter.
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kazuyuki saito
Session ID: 10B-09
Published: 2010
Released on J-STAGE: July 17, 2014
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Alongheng Baated, Keun-Soo Kim, Katsuaki Suganuma
Session ID: 10C-01
Published: 2010
Released on J-STAGE: July 17, 2014
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Naoki Saito, Naokazu Murata, Kinji Tamakawa, Ken Suzuki, Hideo Miura
Session ID: 10C-02
Published: 2010
Released on J-STAGE: July 17, 2014
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Both electromigration and stress-induced migration resistances of electroplated copper thin film interconnections were discussed experimentally. It was found that the micro texture of the interconnections varied dramatically from fine columnar grains to large polycrystalline grains depending on the conditions of electroplating and annealing. The migration resistances also changed drastically depending on the micro texture. It was also found that sulfur atoms degrades the stress-induced migration resistance significantly.
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Kohta Nakahira, Hiroki Kishi, Ken Suzuki, Hideo Miura
Session ID: 10C-03
Published: 2010
Released on J-STAGE: July 17, 2014
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Local deformation of silicon chips mounted on area-arrayed fine metallic bumps has increased drastically in mobile application because of the thinning of the chips. Since such local deformation increases the amplitude of the local residual stress in the chips, the reliability of the chips is degraded seriously. In this study, the effect of the mechanical properties of underfill material on the local deformation was measured by using stress-sensing chips. It was found that the dominant factors of the local deformation changed drastically as a function of the bump pitch.
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Youhei Sejimo, Yosiharu Kariya, Takasi Kimura
Session ID: 10C-04
Published: 2010
Released on J-STAGE: July 17, 2014
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Masanori NOGUCHI, Yukio SAITO, Okitoshi TSUNODA
Session ID: 10C-05
Published: 2010
Released on J-STAGE: July 17, 2014
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Hideki Mizushina, Masataka Hirokawa, Jun Kamiya, Satoru Haga
Session ID: 10C-06
Published: 2010
Released on J-STAGE: July 17, 2014
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Masaki Hashizume, Kenichi Uchikura, Akira Ono, Hiroyuki Yotsuyanagi, M ...
Session ID: 10C-07
Published: 2010
Released on J-STAGE: July 17, 2014
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We propose a built-in test circuit for testing opens that occur at interconnects between ICs and a test method with it in this paper. Also, test input vectors for tests using the test circuit are proposed that will be provided with a boundary scan mechanism. Furthermore, we show that opens at interconnects between ICs can be detected with the test circuit by Spice simulation.
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Yasuhiko Hara, Narihiro Kawada, Kenji Shirai, Yoshikazu Kobayashi, Hid ...
Session ID: 10C-08
Published: 2010
Released on J-STAGE: July 17, 2014
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Akikazu Shibata
Session ID: 11A-01
Published: 2010
Released on J-STAGE: July 17, 2014
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The technology has been developed now including Japan, Europe and Korea. JPCA developed a JPCA standard based on the ePADs group activities of JIEP as JPCA EB-01 1Ed in June 2008 and was revised by JIEP and JPCA to 2nd Ed. and published in June 2009. The document was reported at meetings of IEC and IPC. JPCA EB-01, 2nd Ed. was proposed to IEC/TC91 in October 2009 as a PAS and approved is now an official international document. An effort is being made in Korea and they are proposing a document on electrical measurement of device embedded boards.
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masashi miyazaki
Session ID: 11A-02
Published: 2010
Released on J-STAGE: July 17, 2014
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The coming generations of portable products require the miniaturization, the demand for higher density of functions, and increasing signal frequencies. In order to satisfy these requirements, we have developed new hardware technology of module products called EOMIN (Embedded Organic Module Involved Nanotechnology).This paper describes the performance of small DCDC converter module which made by EOMIN. FEM simulations of thermal performance of embedded chip and connection reliability to embedded components will be presented.
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Hideya Murai, Kentaro Mori, Masaya Kawano, Shintaro Yamamichi
Session ID: 11A-04
Published: 2010
Released on J-STAGE: July 17, 2014
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Susumu Honda
Session ID: 11A-03
Published: 2010
Released on J-STAGE: July 17, 2014
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Embedded active and passive technology for interposer and main board has been advancing rapidly for ultra-small size and high performance electronic products. Nowadays, the Si interposer by approaching interposer wiring to IC chip global wiring has been resulting to the convergence of IC chip and interposer. Ultra-thin chip components and Si-based IPDs are also being produced for the embedded passive components. These new trends and main targets will be presented.
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Katsumi Miyama, Hiroyuki Tanaka
Session ID: 11A-05
Published: 2010
Released on J-STAGE: July 17, 2014
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Katsuya Kikuchi, Koichi Takemura, Chihiro Ueda, Osamu Shimada, Toshio ...
Session ID: 11A-06
Published: 2010
Released on J-STAGE: July 17, 2014
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Koichi Takemura, Katsuya Kikuchi, Chihiro Ueda, Kazuhiro Baba, Masahir ...
Session ID: 11A-07
Published: 2010
Released on J-STAGE: July 17, 2014
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Tomokazu Tanase, Hiroshi Nakano, Satoru Amou, Haruo Akahoshi, Yoshitak ...
Session ID: 11A-08
Published: 2010
Released on J-STAGE: July 17, 2014
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Akinobu Ohno, Tetsuro Eda
Session ID: 11A-09
Published: 2010
Released on J-STAGE: July 17, 2014
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Satoru Shimizu, Aya Iwakiri
Session ID: 11A-10
Published: 2010
Released on J-STAGE: July 17, 2014
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Hideyuki Kuri, Naoki Okamoto, Takeyasu Saito, Kazuo Kondo, Masaru Buny ...
Session ID: 11A-11
Published: 2010
Released on J-STAGE: July 17, 2014
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Yohei Wakuda, Masaharu Sugimoto, Mitsuhiro Watanabe, Hideo Honma
Session ID: 11A-12
Published: 2010
Released on J-STAGE: July 17, 2014
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Masaki Kobayashi, Takaaki Maruyama, Masaharu Sugimoto, Hiroaki Kouzai, ...
Session ID: 11A-13
Published: 2010
Released on J-STAGE: July 17, 2014
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Tomohito KATO, Kunihito BABA, Mitsuhiro WATANABE, Hideo HONMA
Session ID: 11A-14
Published: 2010
Released on J-STAGE: July 17, 2014
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Mitsuyoshi Matsuda, Takuya Takahashi, Sachio Yoshihara, Makoto Dobashi
Session ID: 11A-15
Published: 2010
Released on J-STAGE: July 17, 2014
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Yuka Iwamoto, Shingo Nishiki, Takashi Matsunami
Session ID: 11A-16
Published: 2010
Released on J-STAGE: July 17, 2014
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Tatsuma Kaneda, Masaharu Sugimoto, Katsuhiko Tashiro, Mitsuhiro Watana ...
Session ID: 11A-17
Published: 2010
Released on J-STAGE: July 17, 2014
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Yoshiyuki Nishimura, Sayaka Arashiro, Kunihito Baba, Mitsuhiro Watanab ...
Session ID: 11A-18
Published: 2010
Released on J-STAGE: July 17, 2014
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Low dielectric material has been commonly used as a printed circuit board substrate to reduce the dielectric loss. PTFE is one of the candidates for such a Low-k material. Conventionally, a complicated etched surface has to be created by a strong etching media in order to achieve a good adhesion between the deposited metal and substrate. However, this complicated etched surface becomes a problem due to the transmission loss through the skin effect. Therefore, we focused on the applicability of a Cyclo Olefin Polymer (COP) that has an electric characteristic equal to PTFE.
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Werner Kuhr, Steven Shi, Craig Rhodine, Shigeo Nakamura, Yoichi Kubota
Session ID: 11A-19
Published: 2010
Released on J-STAGE: July 17, 2014
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To achieve a good adhesion b/w smooth Cu circuit and insulation in multilayer PWB, we have developed a molecular interface layer that provides adhesion without roughening the Cu. The Cu surface is modified with a molecular reagent that promotes adhesion to the subsequently applied dielectric layer, using a reaction to functionalize Cu and provide adhesion sites in a single step. This simplifies the treatment process and provides significant cost savings. Examination of the treated surfaces with peel test and cross section after reflow and HAST shows the robustness of the new process.
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Shinichi Kunimatsu
Session ID: 11A-20
Published: 2010
Released on J-STAGE: July 17, 2014
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Kenichi Shirota, Hok Huor Ou, Seiji Nishi
Session ID: 11A-21
Published: 2010
Released on J-STAGE: July 17, 2014
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Generally, A bandpass filter for 60GHz band is designed by using waveguide, A bandpass filter designed by strip line structure, easily fine pitch design, with PCB using low dielectric constant and low loss material (Graft Polymer).As a result, a bandpass filter, good characteristics and good consistency with simulation, was proposed.Also it will be expected to enable low cost and fine pitch design of millimeter wave circuits and to be useful for WiGig applications.
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Chiharu Miyazaki
Session ID: 11B-01
Published: 2010
Released on J-STAGE: July 17, 2014
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The regulation for radiated emission from information technology equipments above 1 GHz is provided by CISPR 22 (Ed. 5, Amd. 1, 2005). This regulation has been scheduled to the beginning of mission in start Japan and Europe since 2010. This paper shows the limits for the radiation emission (CISPR 22, Ed. 5, Amd. 1,2005), the measuring instruments (CISPR 16-1-1, Ed. 2, Amd. 1, 2006), the measurement methods (CISPR 16-2-3, Ed. 2, 2006) and the measurement site evaluation methods (CISPR 16-1-4, Ed. 2, 2007).
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Toshiyuki Kaneko
Session ID: 11B-02
Published: 2010
Released on J-STAGE: July 17, 2014
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Akio Fukuda, Kohji Koshiji
Session ID: 11B-03
Published: 2010
Released on J-STAGE: July 17, 2014
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Yagi Akira, Kohji Koshiji
Session ID: 11B-04
Published: 2010
Released on J-STAGE: July 17, 2014
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Hodeo Kikuchi
Session ID: 11B-05
Published: 2010
Released on J-STAGE: July 17, 2014
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