For the purpose of grain boundary diffUsion experiments, 4mmφ rods with coarse bamboo-structure were prepared by cold working and recrystallization of 99.999% high pure aluminum ingot as received. These rods were covered with about 10μ thick Zn layer by electroplating, and diffusion-annealed at 250°C for up to 2000hr. After diffusion annealing, these rods were cut into an adequate form for the determination of concentration distribution around the grain boundary by line scanning of E. P. M. A.
Experimental data were analyzed by many solutions for grain boundary diffusion such as Fisher's, Whipple's, Suzuoka's and finite-thickness source solutions. The last solution was introduced by the present authors.
The results obtained concerning with the penetration of Zn along random boundaries of pure aluminum are as follows:
(1) The grain boundary diffusion experiment of Zn in aluminum may be done most adequately at about 250°C. At lower temperatures it is very time consuming, and at higher temperatures it is very diffcult to separate boundary diffusion from bulk diffusion.
(2) The penetration depth of Zn along grain boundary increases with the orientation difference of neighboring grains.
(3) Under the conditions of 10μ thick Zn layer and 250°C×1000hr diffUsion heating, C=0.01 contour obtained by Whipple's solution is in the best fit with the experiments, from which 0.57×10
-14cm
3/sec is adopted as the most probable value of aD', where aD'is the mean value of aD'in the range ofrelative orientation difference of 5∼30°.
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