IEEJ Transactions on Fundamentals and Materials
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
Volume 144, Issue 1
Displaying 1-16 of 16 articles from this issue
Special Issue on Technology 2024: Review of Fundamentals and Materials Research
Special Issue Review
Paper
  • Masatsugu Shimoda, Akihito Otani
    2024 Volume 144 Issue 1 Pages 23-28
    Published: January 01, 2024
    Released on J-STAGE: January 01, 2024
    JOURNAL RESTRICTED ACCESS

    This paper describes a QAM signal evaluation method in a radio communication evaluation system based on under-sampling. Although frequency elements generated by quadrature demodulation can be calculated using QAM symbols on a constellation, this technique requires a symbol synchronous trigger. Our proposed method has a software triggering technique that can extract the symbols regardless of the frequency difference. Numerical simulation with 16QAM showed good synchronization between the trigger and the measured waveforms. In addition, the results of demonstration experiment using 16QAM with carrier frequency of 28 GHz showed the practicality of the proposed method by drawing an eye pattern and a constellation. In conclusion, we show the possibility of high-resolution and low-cost measurement in QAM signals with mmWave carrier frequency.

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  • Takuma Uemura, Atsushi Komuro, Ryo Ono
    2024 Volume 144 Issue 1 Pages 29-34
    Published: January 01, 2024
    Released on J-STAGE: January 01, 2024
    JOURNAL RESTRICTED ACCESS

    In this paper we measured the electrical potential distribution of surface dielectric barrier discharges caused by alternating voltage in synthetic air and nitrogen using the Pockels effect. It was shown that different potential distributions of filament thickness and length are generated in synthetic air and nitrogen. A filament analysis based on mathematical morphology was performed to quantify the geometric characteristics of the filaments produced in each gas atmosphere. The results show that the discharge filament thickness and the entropy in the filament direction depend on the oxygen ratio and the magnitude of the applied voltage.

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