Journal of the Spectroscopical Society of Japan
Online ISSN : 1884-6785
Print ISSN : 0038-7002
ISSN-L : 0038-7002
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Volume 57, Issue 2
Displaying 1-4 of 4 articles from this issue
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  • Spectrochemical Analysis in Flames
    Kenji KODAMA, Kuniyuki KITAGAWA
    2008 Volume 57 Issue 2 Pages 69-80
    Published: April 15, 2008
    Released on J-STAGE: January 13, 2012
    DOIhttps://doi.org/10.5111/bunkou.57.69
    JOURNAL FREE ACCESS
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    Spectrochemical analysis is established as a powerful tool for elucidation of combustion phenomenon. The pur-pose of this article is to explain what spectrochemical method is, and demonstrate how to analyze combustion phenomena. Spontaneous emission spectroscopy for time-resolved temperature profiling and isotope-shift planar laser-induced fluorescence spectroscopy for visualization of steam addition effect are reviewed as examples of study. In addition, recent developments in laser-induced plasma spectroscopy named chemical seeding LIPS are surveyed. Keywords: two-dimensional, spectroscopic analysis, planar laser-induced fluorescence, laser-induced plasma spectroscopy, industrial furnaces
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  • [title in Japanese]
    [in Japanese], [in Japanese]
    2008 Volume 57 Issue 2 Pages 81-83
    Published: April 15, 2008
    Released on J-STAGE: January 13, 2012
    DOIhttps://doi.org/10.5111/bunkou.57.81
    JOURNAL FREE ACCESS
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  • [title in Japanese]
    [in Japanese]
    2008 Volume 57 Issue 2 Pages 84-86
    Published: April 15, 2008
    Released on J-STAGE: January 13, 2012
    DOIhttps://doi.org/10.5111/bunkou.57.84
    JOURNAL FREE ACCESS
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  • Modern X-ray Spectroscopy
    II. X-ray Fluorescence Analysis with Scanning X-ray Microprobe
    Yasuko TERADA
    2008 Volume 57 Issue 2 Pages 87-92
    Published: April 15, 2008
    Released on J-STAGE: January 13, 2012
    DOIhttps://doi.org/10.5111/bunkou.57.87
    JOURNAL FREE ACCESS
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    A recent advance in X-ray microscope is reviewed. X-ray focusing optics such as total-reflection mirror and Fresnel zone plate for high energy X-ray region were developed, and a focused beam size of almost 1μm was achieved in an energy range below 100 keV. This paper also introduces some practical examples, obtained by a scanning X-ray microprobe at SPring-8.
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