Journal of the Spectroscopical Society of Japan
Online ISSN : 1884-6785
Print ISSN : 0038-7002
ISSN-L : 0038-7002
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Volume 10, Issue 4
Displaying 1-5 of 5 articles from this issue
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  • [title in Japanese]
    [in Japanese]
    1962 Volume 10 Issue 4 Pages 181-183
    Published: August 31, 1962
    Released on J-STAGE: June 28, 2010
    DOIhttps://doi.org/10.5111/bunkou.10.181
    JOURNAL FREE ACCESS
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  • [title in Japanese]
    1962 Volume 10 Issue 4 Pages 183-189
    Published: August 31, 1962
    Released on J-STAGE: June 28, 2010
    DOIhttps://doi.org/10.5111/bunkou.10.183
    JOURNAL FREE ACCESS
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  • X-ray Spectrochemical Analysis of Slags and Cements by X-ray Quantorecorder
    Hiroshi TSUKIYAMA, Tadao WAKABAYASHI
    1962 Volume 10 Issue 4 Pages 190-202
    Published: August 31, 1962
    Released on J-STAGE: June 28, 2010
    DOIhttps://doi.org/10.5111/bunkou.10.190
    JOURNAL FREE ACCESS
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    X-ray spectrochemical analysis is successfully applied to determine TFe, MnO, CaO, P205, Si02, Al2O3 in slags and cement by the use of X-ray quantorecorder which can analyze simultaneously up to twelve elements that compose the samples in one to five minutes.
    Each of the samples is briquetted in Al-ring of 27 mm dia.by a press at 10, 000 kg to avoid errors caused by ununiformity of packing.
    The errors of analysis found from working curves are comparable to theoretical errors calculated from reproducibility.This gives the possibility of applying the above method to rapid analysis of quality control in iron or steel and cement industries.
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  • Equipment for the Evaporation Method
    Tokunosuke NAKAJIMA, Hiroshi KAWAGUCHI, Kyoichiro TAKASHIMA
    1962 Volume 10 Issue 4 Pages 202-206
    Published: August 31, 1962
    Released on J-STAGE: February 23, 2011
    DOIhttps://doi.org/10.5111/bunkou.10.202
    JOURNAL FREE ACCESS
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    An apparatus is devised for the evaporation method or preliminary fractional distillation method in spectrographic analysis.As in a similar equipment described by Pszoniski, electric resistance heating is used, and a graphite crucible containing the sample serves as the heating element. Temperature measurements are carried out with a specially designed radiation pyrometer using a photomultiplier tube 931A.Electric current is controlled with the aid of a motor-driven moving iron core reactor.Volatile impurities are evaporated and collected on the top of a graphite or copper rod which is then used as the sample electrode for spectrographic determination.Distillation is carried out in air.
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  • Interference Phenomena of Silicon and Germanium Single Crystal Wafers by Infrared Spectrophotometry
    Kenzo SATO
    1962 Volume 10 Issue 4 Pages 206-214
    Published: August 31, 1962
    Released on J-STAGE: February 23, 2011
    DOIhttps://doi.org/10.5111/bunkou.10.206
    JOURNAL FREE ACCESS
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    Infrared absorption spectroscopy is being adopted to investigate the band structure and impurity-energy levels of semiconductor materials such as Si and Ge, etc.Usually the wave length regions for investigating these problems are 1-2/μfor band structure and 20-50μfor impurity levels.
    In the region of 5-16μ, optical interference phenomenon of thin wafers, 50-200μ in thickness, made of Si and Ge single crystals is studied by infrared absorption spectroscopy.
    The interference was found very sensitive for the thickness and surface treatment of the crystals.
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