Journal of the Spectroscopical Society of Japan
Online ISSN : 1884-6785
Print ISSN : 0038-7002
ISSN-L : 0038-7002
Volume 11, Issue 4
Displaying 1-6 of 6 articles from this issue
  • Hiroshi KOKUBUN
    1963 Volume 11 Issue 4 Pages 147-155
    Published: April 30, 1963
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
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  • Taku HAGIHARA, Mamoru HARADA
    1963 Volume 11 Issue 4 Pages 156-165
    Published: April 30, 1963
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Emission spectrochemical analysis of steel products is considerably affected by segregation of elements and inclusions in specimens.To cope with this inconvenience in routine check analysis of low alloy steels, “movable electrode stand”has been devised with which the electric discharge is obtained while the test piece is being moved.
    In using this method, proper choice of excitation conditions is necessary, for the intensity ratio of spectrum lines is different from what the usual method gives, and careful designing of the electrode assembly, the constancy of moving velocity in particular, is important for the assurance of reproducibility of analysis.
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  • Kenzo SATO
    1963 Volume 11 Issue 4 Pages 166-174
    Published: April 30, 1963
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    By the use of a reflection spectrophotometer, the interference phenomenon by a single optical layer is made visible in the epitaxial layer made of single crystalline semiconductors such as Si and Ge.
    The interference in the infrared region 5-16μ is essentially the same as that observed on thin wafers of single crystalline materials provided that the effect of slanting incidence and the phase shift by reflection are duely considered.
    The relation between the thickness of the layer and the separations between adjacent interference maxima in wave number units is correctly represented by an empirical formula as v=C/T where C is a constant.
    By the use of the interference phenomeon, measurement of the thickness of the epitaxial layer is found to be possible within an error of 0.3μ for samples of 3-20μ in thickness.
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  • Hirokazu ASAI
    1963 Volume 11 Issue 4 Pages 175-180
    Published: April 30, 1963
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Experience obtained from two years' operation of a quantovac which was installed in the Amagasaki Iron & Steel Mfg Co.for improvement of routine anlysis of iron and steel is told .It was found that the motor generator, vacuum pump and many other equipments should be carefully looked after. Especially the grating must be well attended for precise analysis of phosphorus in steel.
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  • Kazuo MURAKAMI, Shigeru KIMURA, Teizi NAKAGAWA
    1963 Volume 11 Issue 4 Pages 181-184
    Published: April 30, 1963
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Spectrophotometric methods with monochromatic light sources are being widely used in dyestuff and paint industries for the measurement of fluorescent characteristics of materials. These methods are not practical when we wonder how the characteristics would be in sunlight or under incandescent tungsten-filament and fluorescent lamps.
    A new type fluorescence reflectance measuring attachment for recording spectrophotometers is devised. As the light source, a 500 W Xe lamp regarded as the nearest approach to the sunlight is used.The light falls perpendicularly on the sample and a standard white surface simultaneously and the reflected lights in 45° direction fall alternately on the slit of the recording spectrophotometer by means of a set of plane and concave mirrors.Curves of spectral reflectance in a range of 370-700 mμ are recorded on charts.
    Several colored samples of fluorescent and non-fluorescent finished sheets of cloth have been measured and the results are compared with the data obtained on a Hardy-type spectrophotometer.
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  • 1963 Volume 11 Issue 4 Pages 197
    Published: 1963
    Released on J-STAGE: February 23, 2011
    JOURNAL FREE ACCESS
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