電気学会論文誌A(基礎・材料・共通部門誌)
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
136 巻, 6 号
選択された号の論文の16件中1~16を表示しています
特集:広帯域電磁界の電子機器および通信に対する障害
特集論文
  • 伊藤 真也, 藤元 美俊, 堀 俊和, 原田 知育, 服部 佳晋
    2016 年 136 巻 6 号 p. 330-335
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    In recent years, a problem of interfering by artificial noises from a electrical power transfer become large and deterioration of a sound quality of an AM radio is worried. In this paper, a noise suppression system using quadrature demodulation techniques is proposed to reduce the effect of the interfering. The proposed system utilizes a fact that the quadrature signal includes only the interference, while the in-phase signal from the demodulator includes both of AM signal and interference. To cancel the noise component in the in-phase signal, the noise component in the quadrature signal is adjusted by a tapped delay line because the sign of the both interference is different each other. Weight coefficients of the tapped delay line are determined based on power inversion (PI) algorithm. Thus, the interference in the in-phase signal can be canceled by the quadrature signal. Validity of the proposed system is shown through computer simulations.
  • Shigeki Minegishi, Ken Kawamata
    2016 年 136 巻 6 号 p. 336-340
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    A transition duration at the steady arc occurrence and termination caused by interrupting a current is measured. In consideration of the fast transients and high frequency discharge phenomena due to interrupting the current, a transmission line system was introduced. It consists of a coaxial switch, coaxial cables as transmission lines on the right and left sides of the switch, and termination resistors. The material of the inner conductor of the coaxial switch for interruption of the current is silver and copper. The resistors were designed to match the characteristic impedance of the cables. A semi-rigid cable as a coaxial cable and a coaxial attenuator (DC∼8.5GHz) as the termination resistor were used on the right side of the switch for measurement of transition duration. When the current is interrupted by the switch, the transient waveform of output of the attenuator is measured by an oscilloscope (DC∼4.5GHz). Regardless of the materials of the center conductor of the switch, the transition duration at the arc occurrence and termination caused by interrupting low current (0.5-1.0A) is 0.2∼0.4 ns and 1.28∼2.08 ns, respectively, and does not depend on the material of the inner conductor of the switch and current value. The transition duration at the arc occurrence is very rapid.
  • 石田 武志, 肖 鳳超, 上 芳夫, 藤原 修, 仁田 周一
    2016 年 136 巻 6 号 p. 341-346
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    In electrostatic discharge (ESD) immunity tests specified by the international electrotechnical commission (IEC), it has been learned empirically that a contact discharge test sometimes provides a severe test result even under the same test level. This is said to be due to the existence of small air gaps between an ESD generator and equipment under test. To clarify the phenomena, we previously measured discharge currents through small air gaps from 30 µm to 1000 µm in contact discharges of an ESD generator to an IEC current calibration target, which revealed that multiple current peaks appear depending on the gap length and test voltage as well. It was also demonstrated that the contact discharge current with a small gap provides a faster rise time and larger current peak in comparison with normal contact discharge tests even at the same test voltage. In this study, to explain these findings quantitatively, we proposed a simplified circuit model combined with a spark-resistance formula which allows one to analyze the discharge currents through the above-mentioned air gaps in 8 kV contact discharge tests. As a result, we found that the calculated waveforms in contact discharges with/without a gap fairly agree with the measured results. It was also found that the proposed circuit provides roughly the same dependence of current peaks on a gap length as the measured results.
  • 佐藤 友哉, 林 優一, 水木 敬明, 曽根 秀昭
    2016 年 136 巻 6 号 p. 347-352
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    The intensity of unintended electromagnetic radiation caused by connector contact failure mainly depends on the increased inductance at the contact failure portion. Self-inductance caused from increased current path at the contact boundary surface has been considered the factor of increased inductance. However, investigation of mutual inductance due to the interaction among contact points is insufficient. In this paper, by using contact failure model, calculated current path length and increased inductance including mutual inductance are compared. The result shows that the more current path lengthens, the more mutual inductance increases. Mutual inductance should be considered when estimating contact failure.
  • 高 義礼, 石田 武志, 藤原 修
    2016 年 136 巻 6 号 p. 353-358
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    In the electrostatic discharge (ESD) immunity testing specified by the IEC 61000-4-2, an ESD generator simulating a human ESD is normally used for contact discharges, while air discharge testing is also being accepted despite the fact that the testing is likely to provide inconsistent test results from the poor reproducibility of discharge current waveforms. To confirm to what extent air discharges affect the discharge currents with respect to charge voltages and approach speeds, we measured the discharge currents through a hand-held metal piece with fast and slow approaches from a male subject charged from 1000 V to 8000 V, which were calculated from two equivalent circuits. An equivalent circuit with an ideal switch in view of a spark was used to show the limit waveform of the discharge current through the inverse Fourier transform from the measured human impedance. The other equivalent circuit consisting of a time varying spark resistance and lumped circuit parameters derived from the human body impedance was used to estimate the discharge current based on a spark resistance formula. As a result, we found that the first equivalent circuit provides the maximum current peak and minimum rise time of discharge currents regardless of the charge voltages or approach speeds, while under an appropriate spark length according to the charge voltage the second equivalent circuit gives the discharge current waveform that approximately coincides with the measured result.
  • 大津 孝佳, 堂山 英之, 鷺坂 功一, 白山 太一
    2016 年 136 巻 6 号 p. 359-364
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    The ESD robustness of the electric device becomes weak year by year because of the high frequency operation. For that reason, the development of a countermeasure technology is necessary. Especially, the countermeasure technology in the system level is important for the next generation electric devices. In this paper, the discharge current and the radiated electromagnetic wave caused by ESD from ESD countermeasure materials which are conductive composite resin with a carbon fiber, a carbon nano fiber and a carbon nano tube were investigated.
  • 五百旗頭 健吾, 田井 伸拓, 籠谷 裕人, 大西 紘之, 豊田 啓孝, 渡辺 哲史
    2016 年 136 巻 6 号 p. 365-371
    発行日: 2016/06/01
    公開日: 2016/06/01
    ジャーナル フリー
    Cryptographic circuits were analyzed regarding their side-channel information leaking behavior based on internal current source. Cryptographic circuits were implemented in an FPGA with registers arranged to demonstrate three known side-channel information leaking behaviors; (1) leakage is reduced by making Hamming distance (HD) at registers constant, (2) leakage increases with signal-to-noise ratio of side-channel traces, and (3) unbalance of routing path from registers to load circuits produces leakage. The implemented circuits were measured in terms of voltage fluctuation in the power distribution network for FPGA core circuit where the circuits were implemented. The measured voltage fluctuations were converted into internal current sources that were exploited to analyze the information leaking behavior by applying a side-channel analysis, correlation power analysis (CPA). The analysis confirmed that internal current source clearly demonstrated the side-channel information leaking behaviors. This results suggests that internal current source would allow to understand what parts of encryption circuits largely contribute to leak information and how to develop an efficient and low-cost countermeasure against side-channel attacks.
特集研究開発レター
論文
研究開発レター
部門記事
 
feedback
Top