-
Improvement of cutting efficiency in the roughing and the finishing processes.
Takenori Oono, Takashi Matsumura
Session ID: B36
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
An improvement of cutting efficiency in glass milling is discussed. In cutting tests, characteristics of brittle fracturing are observed in the roughing and the finishing process to improve the cutting efficiency. As the result, it is shown that an axial length of fractured area is less than 0.01mm in roughing process. And the fractured area can be removed with finishing process at a axial depth cut of more than the axial length of farctured area.
View full abstract
-
Koji Mishima, Yasuhiro Kakinuma, Tojiro Aoyama
Session ID: B37
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Masahiro Hagino, Takasi Inoue
Session ID: B38
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Shunsuke Iso, Yoshikazu Kobayashi, Kenji Shirai, Kouichi Tozawa
Session ID: B39
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
The purpose of this study is improving the accuracy of surface textures. In end mill machining, error arises as a result of tool flexure, and revising machining error margin caused in that case. We develop the system that forecasts amount of fluctuation due to flexure of a tool on end mill machining. For this purpose, we suggested that application method to machining with considering flexure of tool holding parts and so on. In this report, we introduces the outline, the accuracy forecast methodology of the surface texture and forecasted shapes.
View full abstract
-
Observation of Undeformed Chip Thickness in Ball End Milling for Inclined Surface
Jun'ichi KANEKO, Koutaro TOKUNAGA, Kenichiro HORIO
Session ID: B40
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Keiji Ogawa, Heisaburo Nakagawa, Shinjirou Matsuyama, Satoshi Nishimur ...
Session ID: B44
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
The cutting phenomena in micro end-milling were investigated in the present study. The cutting force was monitored by a high accuracy dynamometer in micro end-milling for hardened die steels. Moreover, tool wears and chips were observed in detail. As a result, the unique feature was indicated in micro endo-milling.
View full abstract
-
Cutting Force on Micro End Milling
Atsushi Kataoka, Mitsuyoshi Nomura, Takayuki Shibata, Yoshihiko Muraka ...
Session ID: B45
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Effect of Materials by Micro End Mill
Wataru Takahashi, Mitsuyoshi Nomura, Takayuki Shibata, Yoshihiko Murak ...
Session ID: B46
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Kazuya Hamaguchi, Akihiro Hirayama, Masatoshi Aritoshi
Session ID: B47
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Naoki Yoshikawa, Masahiko Yoshino
Session ID: B61
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Masahiko Yoshino, Yoshiyuki Namatame
Session ID: B62
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Norikazu Suzuki, Hideo Yokoi, Eiji Syamoto
Session ID: B63
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Saeid Amini, Norikazu Suzuki, Eiji Shamoto
Session ID: B64
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
Ultrasonic vibration cutting processes are modeled and simulated in the present research, utilizing MSC-Marc FEM software. The vibration is applied to the cutting tool in one or two directions denoted by vibration cutting (VC) and elliptical vibration cutting (EVC), respectively. The cutting forces and the stresses developed within the workpiece during the vibration cutting processes are estimated and compared with those in the conventional cutting (CC) process. The influence of various parameters such as speed ratio and amplitude are subsequently investigated. It is partially concluded that though the cutting force fluctuates periodically in VC and EVC, its average value changes from CC to VC and EVC in descending order. The cutting force decreases with a rise in the speed ratio in EVC and does not change in VC.
View full abstract
-
Proposal of texturing method by high-speed amplitude control
Norikazu Suzuki, Eiji Shamoto, Seiji Hamada, Takashi Ueyama
Session ID: B66
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Takanobu Oba, Tomohiko Kawai, Hideo Takino, Yoshimi Takeuchi
Session ID: B67
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
The study deals with the milling of the mold of a spherical micro lens array. A diameter of each lens was sub-millimeter. To effectively shape each lens with high accuracy, a single crystal diamond tool, whose cutting blade was 90 degree or less, was used as an end mill. Using an ultraprecision milling machine, the tool rotating around its axis was feed along the desired radius of each lens surface. As a result, the mold with a spherical micro lens array was effectively shaped with high accuracy.
View full abstract
-
Hiroshi Saito
Session ID: B68
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
The process of Micro Pillar
Toshihiro Takahashi, Tsuneyuki Kobayashi, Hiroshi Saito, Hiroshi Takay ...
Session ID: B69
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
A Determination Method of Effective Tool Postures in 3+2-axis Control Milling
Mitsuru Tsunoda, Keiichi Nakamoto, Keiichi Shirase
Session ID: B73
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
5-axis control milling is widely adopted to manufacture valuable parts in such fields as aerospace, automotive and die/mold industries. However, it takes extensive amount of time and efforts to determine the process planning parameters by skilled engineers because the machining process is much complicated. On the other hand, 3+2-axis control milling is often operated for high efficient milling on a 5-axis controlled machine tool. Machining accuracy can be improved and tool trajectory becomes simple in 3+2-axis control milling. However, it is difficult to determine the effective indexing angle automatically. Therefore, a calculation method of machined volume at each indexing angle is proposed. Free-form surfaces are focused on target shapes because it is difficult to recognize machining features. This report deals with a rapid determination method of the effective tool postures based on the machined volume.
View full abstract
-
Ryota Tanabe, Jiang Zhu, Tomohisa Tanaka, Yoshio Saito
Session ID: B74
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Chengri Cui, Kazuya Takahashi, Masaomi Tsutsumi
Session ID: B75
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Generation of 6DOF Force Feedback
Yuu Yamagishi, Koichi Morishige
Session ID: B76
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Makoto Kaneko, Koichi Morishige
Session ID: B77
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Kenji Higashiyama, Chengri Cui, Masaomi Tsutsumi
Session ID: B79
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Naoki Miyama, Tomoyuki Saeki, Chengri Cui, Masaomi Tsutsumi
Session ID: B80
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
5th report: Measurement that assumes face milling by using end mill
Yukitoshi Ihara, Junki Ota, Satoshi Kubota
Session ID: B81
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Effect of measurement conditions on 3-D circular motion
Masaomi Tsutsumi, Daisuke Yumiza, Wataru Nishiigami, Kosuke Suzuki
Session ID: B82
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Kousuke Suzuki, Tomoyuki Saeki, Masaomi Tsutsumi
Session ID: B83
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Kazuhiro Hane, Yoshiaki Kanamori, Kazunori Takahashi, E. Bulgan
Session ID: C01
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Toshitaka Wakayama, Toru Yoshizawa
Session ID: C03
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Masato Yamada, Tatsuo Arai, Yoshiyuki Matsumura, Yasuyuki Kanou
Session ID: C04
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Kana Yanogwa, Takeshi Kawajiri, Takaki Harada, Kazuya Yamamoto, Ichiro ...
Session ID: C06
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
We proposed the imaging-type 2D Fourier spectroscopy that has the phase shifter on the Fourier transform plane. The objective lights from the transmissive component and the scattering component of the measurement object are dispersed on the different area of the Fourier transform plane. So, by introducing the spatial filter, we can observe only the spectral characteristics of the scattering component light. Because of the dark filed image, the super resolution spectral imaging for the super fine particle can be realized.
View full abstract
-
Shigeki Nishida, Hiroki Sugano, Hisao Kikuta
Session ID: C07
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
For the development of a novel type color filter named as wavelength selectable filter, a wavelength selectable Fresnel hologram which can reconstruct a different diffraction pattern with a different wavelength was designed and fabricated. As a result of estimating the wavelength resolution for obtaining a different diffraction pattern, 90nm of wavelength differences were acquired with 4x4mm2 hologram size by the computer simulation. Using the obtained wavelength resolution, a binary Fresnel hologram with a size of 4x4mm2 which diffracts with red (632nm) and green (532nm) light was fabricated using an electron beam drawing equipment. As a result, it was made sure that the fabricated hologram acted as a wavelength selectable filter with a wavelength resolution of 100nm.
View full abstract
-
Takeshi Kawajiri, Kana Yanogawa, Yasutoshi Takakura, Takaki Harada, Ka ...
Session ID: C08
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
We proposed the imaging-type 2D Fourier spectroscopy that is a kind of the phase-shift interferometry between the objective lights without the reference lights. The proposed method can realize the 2D spectral imaging at the limited depth with high spatial resolution. In this report, we discuss about the long-stroke phase shifter whose position and attitude can be controlled from the displacement of the fringes of equal inclination to maintain the imaging quality.
View full abstract
-
Kimihiko SATOU, Takanori YAZAWA, Yukio MAEDA, Takashi TAMURA, Tadahiro ...
Session ID: C09
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
In this research, authers proporse high accuracy edge projecting system using spatial frequency filtering and image processing.
View full abstract
-
Yusuke Ushima, Shinya Suzuki, Kazuhide Kamiya, Takashi Nomura, Hatsuzo ...
Session ID: C10
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Yasunori Fujikawa
Session ID: C13
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Azusa Hattori, Fumio Kawamura, Masashi Yoshimura, Yasuo Kitaoka, Yusuk ...
Session ID: C15
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Kosuke Ozawa, Akira Sasaki, Tatsuo Ushiki, Futoshi Iwata
Session ID: C16
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Motohiro Otsuka, Koki Okada, Akira Sasaki, Haruyuki Awano, Makoto Mina ...
Session ID: C17
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Katsuichi Kitagawa
Session ID: C31
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Yangjin Kim, Kenichi Hibino, Youichi Bitou, Sonko Osawa, Naohiko Sugit ...
Session ID: C32
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Local Model Fitting Method for Simultaneous Measurement of Film Thickness and Surface Profile
Takuto Naito, Masashi Sugiyama, Hidemitsu Ogawa, Katsuichi Kitagawa, K ...
Session ID: C33
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Yukitoshi Otani, Yuki Sato, Yasuhiro Mizutani
Session ID: C34
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Toru Takegawa, Yu Watanabe, Yasuhiko Arai, Shunsuke Yokozeki
Session ID: C36
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Hatsuzo Tashiro, Takashi Nomura, Kazuhide Kamiya
Session ID: C37
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
We measured the displacement of the rough surface object with speckle interferometry. The interference fringes are evaluated with four sensors. These change with the displacement of the object sinusoidally. Each phase differences of these are constant, but these are not always equal distance. Therefore these are analyzed by inequality distance phase shift method. As a result, the displacement was measured for the sensitivity of nanometer.
View full abstract
-
Yasuhiko Arai, Daisuke Murashima, Marie Kikukawa, Shunsuke Yokozeki
Session ID: C38
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Interferometric error caused by face plate of CCD image sensor for recording interference pattern
Toshiaki Matsuura, Kazuaki Udaka, Yasushi Oshikane, Haruyuki Inoue, Mo ...
Session ID: C39
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
A phase-shifting point diffraction interferometer (PS/PDI) with two optical fibers is appropriate for absolute surface figure measurement for large aperture optics. Interference pattern formed on CCD image sensor contains several wavefront error or interferometric error caused by imaging optics. Suppression of the interferometric error is attempt by using CCD image sensor, which has no face plate. Interference pattern is formed on the surface of CCD image sensor without any optics.
View full abstract
-
Masaaki Adachi, Yuuki Hirano, Masanori Kawamura, Yuuta Iwao
Session ID: C43
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Masaki Ando, Sho Kanameishi, Yasuhiko Arai, Shunsuke Yokozeki
Session ID: C44
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
-
Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa
Session ID: C45
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
FREE ACCESS
