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Tsuneo Kawano, Haruhiko Hori, Keiichi Shirase
Session ID: E77
Published: 2008
Released on J-STAGE: March 01, 2009
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Yu Ikeda, Takahiro Yamaguchi, Etsuko Kobayashi, Ichiro Sakuma, Yasuhik ...
Session ID: E79
Published: 2008
Released on J-STAGE: March 01, 2009
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Norihiro Koizumi, Deukhee Lee, Kohei Ota, Yugo Suzuki, Shin Yoshizawa, ...
Session ID: E80
Published: 2008
Released on J-STAGE: March 01, 2009
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In this paper, a controller with notch filter is proposed to decrease the oscillation of the mechanical system of the Non-Invasive Ultrasound Theragnostic System. This makes it possible to enhance the feedback gain of the controller and enhance the servoing performance for the kidney stones.
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Algorithm for Robot Imitation
Tohru Matsumoto, DE SILVA Ravindra, Masakazu Kobayashi, Masatake Higas ...
Session ID: E81
Published: 2008
Released on J-STAGE: March 01, 2009
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Hirohisa Narita, Kakeru Harusawa, Makoto Yagihashi, Hideo Fujimoto
Session ID: E82
Published: 2008
Released on J-STAGE: March 01, 2009
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Kazutoshi Katahira, Hitoshi Ohmori, Masayoshi Mizutai, Yoshihiro Uehar ...
Session ID: F07
Published: 2008
Released on J-STAGE: March 01, 2009
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Yohei Akahane, Tomoyuki Saito, Jun Komotori, Kazutoshi Katahira, Masay ...
Session ID: F08
Published: 2008
Released on J-STAGE: March 01, 2009
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Shinjiro Umezu, Masato Nishiura, Noritaka Hara, Kazutoshi Katahira, Hi ...
Session ID: F09
Published: 2008
Released on J-STAGE: March 01, 2009
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Electrostatic inkjet phenomena took place when high voltage was applied between an insulative capillary tube filled with ion conductive liquid and a metal plate electrode. Droplet diameter and dropping frequency were controlled by the voltage application. In this study, the phenomena were applied to dissolve part of metal rod and shin metal sheet. The diameter of the thinned metal rod was controlled. The hole diameter, less than 10 μm to some 100 μm was controlled by the voltage application.
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Yoshihiro Uehara, Norihide Mitsuishi, Tetsuya Naruse, Weimin Lin, Hito ...
Session ID: F13
Published: 2008
Released on J-STAGE: March 01, 2009
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In this research, we developed a system to electrolyze the small type ELID grinding wheel. This system was realized ELID grinding processing without using the minus side electrode, for the purpose of machining of micro lens mold. That result succeeded in the development of the ELID grinding system which uses a nozzle type electrode.
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Masayoshi Mizutani, Tetsuya Naruse, Yutaka Kameyama, Yutaka Koma, Hito ...
Session ID: F14
Published: 2008
Released on J-STAGE: March 01, 2009
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Teruko Kato, Hitoshi Ohmori, Nobuhide Itoh, Kazuhiro Masuda, Hiromitsu ...
Session ID: F15
Published: 2008
Released on J-STAGE: March 01, 2009
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6th Report: Effects of ELID on ground surface
Hiromitsu Tsukakoshi, Nobuhide Itoh, Goroh Itoh, Akihiko Nemoto, Teruk ...
Session ID: F16
Published: 2008
Released on J-STAGE: March 01, 2009
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Evaluation of focusing properties of fabricated long X-ray mirror
Hidekazu Mimura, Shinya Morita, Takashi Kimura, Daisuke Yamakawa, Weim ...
Session ID: F18
Published: 2008
Released on J-STAGE: March 01, 2009
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Shin-ya Morita, Hidekazu Mimura, Weimin Lin, Yoshihiro Uehara, Yutaka ...
Session ID: F19
Published: 2008
Released on J-STAGE: March 01, 2009
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JIANQIANG GUO, Hitoshi OHMORI, Kazutoshi KATAHIRA, Tetsuya NARUSE, Yu ...
Session ID: F20
Published: 2008
Released on J-STAGE: March 01, 2009
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YAG ceramic is considered as the new generation of the high out-put laser material due to its excellent energy. The YAG ceramic chip using for the laser instrument must be fabricated with the very low surface roughness. In this experiment, ELID grinding on the YAG ceramic chip was carried out. Various experimental conditions were investigated in order to get the ground surface with very low roughness. Through the experiment, the ductile ground surface was obtained. The experimental conditions and the results were introduced in this paper.
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Yebing Tian, Hisashi Sato, Junichi Sasaki, Libo Zhou, Jun Shimizu, Tak ...
Session ID: F21
Published: 2008
Released on J-STAGE: March 01, 2009
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Si wafers are widely used as a substrate material for fabricating ICs. The quality of ICs depends on the quality of Si wafer. The Chemo-mechanical Grinding (CMG) process with soft abrasive wheel has been found recently to be a great potential process for machining silicon to generate superior surface quality at low cost. However, to the author knowledge no detail studies on whether new extra scratches be introduced in CMG process or not are reported. There have been very few studies on observing changes of topography of scratches and understanding basic mechanism of elimination of elimination of scratches without introducing new scratches and removal of grinding textures / marks generated by diamond grinding wheel using CMG process without inducing new surface damages. Therefore, a series of experiments have been conducted to study the elimination of surface scratches created on etched wafer surface and grinding residual textures induced by diamond wheel in CMG process. Under all experimental conditions and process, the CMG process exhibited better performance and no new extra scratches were introduced.
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Keiji Tsunokawa, Hitoshi Suwabe, Ken-ichi Ishikawa
Session ID: F31
Published: 2008
Released on J-STAGE: March 01, 2009
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Takayuki KUSUMI, Shogo CHIBA, Daisaku MATSUSHITA, Kazuyuki MATSUSHITA, ...
Session ID: F32
Published: 2008
Released on J-STAGE: March 01, 2009
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Authors have been developed a novel double-sided polishing machine with high efficiency for IT. This machine consists of upper, lower platens and a pallet for works. It has a new mechanism for high efficiency by circular moving each other, and production efficiency three times or more than the similar polishing area machine, because our machine has no rotating shaft. Therefore polishing area becomes larger than other type machine. And, the difference of peripheral speed is able to control the low level, since the work pieces do not turn on an axis, and we obtained good roughness and uniform surface was obtained on a sample glass substrate.
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Kenji Hirose, Toshiyuki Enomoto
Session ID: F33
Published: 2008
Released on J-STAGE: March 01, 2009
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In case of a transparent tool with groove
Tsugio Yamazaki, Kenichiro Horio, Junichi Kaneko, Yoshiki Matsubara
Session ID: F34
Published: 2008
Released on J-STAGE: March 01, 2009
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Kenichiro Yoshitomi, Atsunobu Une, Masaaki Mochida
Session ID: F36
Published: 2008
Released on J-STAGE: March 01, 2009
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Kouji Kishita, Mutsumi Touge, Takayuki Nakano, Junji Watanabe
Session ID: F37
Published: 2008
Released on J-STAGE: March 01, 2009
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Fundamental Examination of the Removal Characteristic under various conditions
Shiro Miyamoto, Akihisa Kubota, Heiji Yasui, Kazuto Yamauchi
Session ID: F38
Published: 2008
Released on J-STAGE: March 01, 2009
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Keishi Yamaguchi, Mutsumi Touge, Junji Watanabe, Takayuki Nakano, Shou ...
Session ID: F39
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
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Akihisa Kubota, Shiro Miyamoto, Takashi Watayo, Heiji Yasui, Kazuto Ya ...
Session ID: F43
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
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Akira Miyoshi, Mutsumi Touge, Takayuki Nakano, Hiroyuki Fukae
Session ID: F44
Published: 2008
Released on J-STAGE: March 01, 2009
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Development of High Productive CMG Wheel
Yoshiaki Tashiro, Masaaki Kemmochi, Junichi Sasaki, Libo Zhou
Session ID: F45
Published: 2008
Released on J-STAGE: March 01, 2009
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Taro Sugita, Hitoshi Tokura
Session ID: F46
Published: 2008
Released on J-STAGE: March 01, 2009
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Koichi Mizutani, Toshihiko Shibuya, Sepasy Zahmaty, Nobuhito Yoshihara ...
Session ID: F62
Published: 2008
Released on J-STAGE: March 01, 2009
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Ryunosuke Sato, Yoshio Ichida, Koji Kato
Session ID: F63
Published: 2008
Released on J-STAGE: March 01, 2009
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Yuuya Yamaguchi, Yasuhiro Tani
Session ID: F64
Published: 2008
Released on J-STAGE: March 01, 2009
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Good polishing performance can be obtained using silica particles as carrier particle in 4-body polishing.
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Naoki Ichinoho, Takeyuki Sakurai, Yuuya Yamaguchi, Yasuhiro Tani
Session ID: F65
Published: 2008
Released on J-STAGE: March 01, 2009
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Filtering of composite abrasives was confirmed to be very important for inproving the polishing performance.
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Hiroki Katta, Hiroki Ando, Satoshi Sakamoto, Yasuo Kondo, Hiroshi Usuk ...
Session ID: F67
Published: 2008
Released on J-STAGE: March 01, 2009
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Akihiro Nakagawa, Yasuhiro Tani, Rakjoo Sung
Session ID: F68
Published: 2008
Released on J-STAGE: March 01, 2009
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Partially coated diamond abrasives were developed for high productivity of tools and high grindability.
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Yongbo Wu, Takashi Sato, Weimin Lin, Toru Tachibana
Session ID: F69
Published: 2008
Released on J-STAGE: March 01, 2009
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Hiroaki Mizuno, Shigeo Shimizu
Session ID: F73
Published: 2008
Released on J-STAGE: March 01, 2009
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Tatsuya Imai, Tohru Takahashi
Session ID: F74
Published: 2008
Released on J-STAGE: March 01, 2009
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Masahiro Ueda, Hirokazu Shimoda
Session ID: F75
Published: 2008
Released on J-STAGE: March 01, 2009
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Shoji Noguchi, Naoko Fujiki
Session ID: F77
Published: 2008
Released on J-STAGE: March 01, 2009
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A major factor that the small ball bearing becomes application limits is wear. The wear occurs because of slipping caused in the bearing at low load. This slipping is called 'orbital slip'. The purpose of this research is to experiment on and quantitatively clarify the orbital slip. As a result of the experiment, the generation of orbital slip was confirmed. Moreover, quantitative data of orbital slip that has not been researched up to now was obtained for the first time. The tendency to orbital slip guessed from this experiment is shown as follows. 1) Orbital slip is generated easily by the rotational speed high and the load low. 2) Standard product slips than high accuracy product when a proper load hangs to the bearing.
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Shoji Noguchi, Ryoko Nozawa
Session ID: F78
Published: 2008
Released on J-STAGE: March 01, 2009
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Shigeo Shimizu, Kazuo Tsutiya, Katsuji Tosha
Session ID: F79
Published: 2008
Released on J-STAGE: March 01, 2009
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-Effect of Improvement of Edge Rotary Accuracy-
Heiji Yasui, Takuro Yoshimura
Session ID: G06
Published: 2008
Released on J-STAGE: March 01, 2009
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Akira Shinozaki, Heiji Yasui
Session ID: G07
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
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Heiji Yasui, Junichi Shimazu, Takeharu Kawabayashi
Session ID: G08
Published: 2008
Released on J-STAGE: March 01, 2009
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Tomotake Matsumoto, Katsuhiko Sekiya, Keiji Yamada, Yasuo Yamane, Masa ...
Session ID: G09
Published: 2008
Released on J-STAGE: March 01, 2009
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Takekazu Sawa, Yasushi Ikuse, Kuniaki Unno
Session ID: G13
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
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Yusuke Tanaka, Heiji Yasui
Session ID: G14
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
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Junichi Muraoka, Hiromasa Ittou
Session ID: G15
Published: 2008
Released on J-STAGE: March 01, 2009
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Hidetake Tanaka, Toshiyuki Watanabe, Kazuhisa Yanagi
Session ID: G16
Published: 2008
Released on J-STAGE: March 01, 2009
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Toshimi Odaki, Susumu Tomita
Session ID: G18
Published: 2008
Released on J-STAGE: March 01, 2009
CONFERENCE PROCEEDINGS
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