Specimens were prepared from AZF, AM 503 and CZM were treated at 100° with many original solutions such as manganese or zinc hydrogen phosphate, mixed solutions of above salt and copper phosphate or manganese sulphate, pefmanganate solution of phosphoric acid, etc. The protective films on electron were compared by corrosibility in 3% NaCl solution with those prepared by means of I. G. method, treated with selenous acid and then heated to 200_??_230° and of others. But they could not find more effective treating solutions than that of known method described above. Afterwards, it was found that a film prepared at 100° with a mixed hot solution of phosphoric acid of manganese dioxide and sodium salt of arsenous acid, or of selenous acid, or of sulphurous acid on the surface of the specimen of AZF, AM 503, CZM and then treated with mixed hot solution of 0.1% NaOH+1.5% K₂CrO₄ was very effective. The effectiveness of the protective film on AZF prepared by means of the above process against corrosion by 3% NaCl solution was almost the same as well as that prepared with selenous acid and heated to 200_??_230°. The film on AM 503 above mentioned was the best quality and could not be compared with those by other methods. The effectiveness of the film on CZM was also comparable with that of I. G. method. The mixed solution of phosphoric acid of manganese dioxide and sodium arsenite, or selenite, etc. was dried, and the solidified substance obtained was named “Magba”. The specimens treated with the aquous solution of Magba and other known solutions and then tested with 3% NaCl solution were shown in photographs. More effective treating solutions than that of 10% selenous acid, for AZF and AZM electrons which contain elements especially high in aluminium and zinc are now under investigation.

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For the synopsis of this work see the Report I; p. 69 on this volume.

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Some experiments have been made as a preliminary application of the rotating target X-ray tube devised by the present writer, and the following results were obtained.
1. The experiment on the progress of the quenching of carbon steels and that of the medium cooling of chromium steels have been explicitly shown a structual change, the occurrence of which has been concluded from the other experimental facts.
2. By the experiments on the change of crystal structure of quenched carbon steels in the ageing period up to 48 hours, it was concluded that the amount of structual changes of α_??_γ and α martensite _??_β martensite which have been observed with the length change by Dr. T. Matsushita is too small to be detected by the ordinary X-ray diffraction pattern.
3. In the course of the cooling of tungsten steels heated above the lowering temperature, the lattice change γ_??_α occurs at the lowered transformation point and at the same time or immediately after it, the carbide precipitates. With the increase of cooling velocity or with the lowering of the transformation point, the diffraction line of α lattice becomes diffused and that of carbide weakens by degrees. These facts confirm the view that the lowered transformation in tungsten steels is the same in nature, as Ar'' in carbon steels, except that the precipitation of carbide takes place due to the high transformation temperature.

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The equilibrium diagram of Al-Zn-Si alloys on the side of Al-Zn was investigated by thermal and dilatometrie analyses From the experimentals result the diagram is ascertained to consist of the primary crystallization surfaces (Al)_α, (Al)β, (Zn) and Si, and univariant reaction lines
Liq._??_(Al)_α+Si
Liq._??_(Al)_β+Si
Lip.+ (Al)_α_??_(Al)_β and invariant points
Liq.+(Al)_α_??_(Al)_β+Si
Liq._??_(Al)β+(Zn)+Si.
From this diagram the reason why the Al-Zn diagrams given hitherto was different from one another is explained theoretically.

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In the experiment the recrystallization of the spattered silver film on a fused quartz plate was observed. The prepared film was 0.09_??_0.65 μ in thickness. The electrical resistance of these films was measured/in vacuum furnace with annealing tempertaure. With ordinary temperature the resistance is increased slightly with temperature. For the films of 0.24 μ, 0.15 μ, and 0.05 μ the electrical resistance begins to decrease from about 120°C or 393°K, which corresponds to the lowest value of temperature-ratio TR/Ts=0.33 or recrystallization given by Tammann, of which TR is the absoiute temperature of the recrystallization and TR is the melting point, the calculated value TR of silver being 401°K. If the film is prepared thinner, the decrease of electrical resistance is steeper. The maximum steepness is located at about 200°C, which corresponds to the so-called recrystallization temperature of silver. The decrease of resistance stops at 410_??_430°C, and then begins to increase from that point. In the state of region from 120°C to 430°C, we can observe the microscopic spherulite, which is the crystallite first formed from the amorphous silver in the molecular field of the quartz plate. With the temperature over 450°C the spherulite begins to aggregate forming the stereo-crystals and the remaining Portions become the window. The spectroscopic method of detecting the recrystallization of silver was used taking advantage of the specific minimum of reflectivity in the ultraviolet It is observed that the surface of thinner films of spattered state are amorphona, while the films crystallize by the further annealing.

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