A microwave prove is proposed, which consists of a waveguide terminated by a dielectric window. The probe is applicable to plasmas whose plasma frequencies are higher than the applied microwave frequency. The principle is based on the measurement of the phase angle of the reflection coefficient at the terminal which is inserted into plasmas. A preliminary experiment with a plasma-simulator shows that the maximum electron density detectable with this probe operating at an X-band frequency of 9550 Mc reaches to 10
17cm
-3, when the dielectric window is used of specific permittivity of ε≅3 and of thickness equal to a quater wavelength. A coaxial-probe is also proposed.
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